Measurement method for bulk conductivity of dielectric material for satellites under temperature gradient and measurement device of measurement method

A technology of dielectric materials and temperature gradients, applied in measuring devices, measuring electrical variables, measuring resistance/reactance/impedance, etc., can solve problems such as blank research and unreported test devices, achieve accurate test results, improve test efficiency, The effect of saving test time

Active Publication Date: 2015-02-25
PEOPLES LIBERATION ARMY ORDNANCE ENG COLLEGE
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the research in this area is still blank, and the corresponding test device has not been reported.

Method used

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  • Measurement method for bulk conductivity of dielectric material for satellites under temperature gradient and measurement device of measurement method
  • Measurement method for bulk conductivity of dielectric material for satellites under temperature gradient and measurement device of measurement method
  • Measurement method for bulk conductivity of dielectric material for satellites under temperature gradient and measurement device of measurement method

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Embodiment 1

[0028] like figure 1 As shown in the figure, the measurement device for the body conductivity under the temperature gradient of the dielectric material for the satellite includes a heat source 5, a temperature acquisition device, a voltage and current acquisition circuit, and a multi-layer circuit board processing technology. layer metal layer. The tested dielectric material 1 is one of epoxy resin, polyimide or polytetrafluoroethylene or a modified dielectric material of one of them. The modified dielectric material is mainly made by doping glass powder, glass cloth, etc. For the new dielectric material formed by the material, the measured dielectric material 1 is made into a cube shape. Each metal layer is provided with a metal sheet 2 with an area S, each metal sheet 2 is a circular copper sheet of the same size, the center of the metal sheet 2 is on a straight line, and the diameter of the metal sheet 2 is close to the measured The side length of the dielectric material ...

Embodiment 2

[0036] Figure 4 Another embodiment of the present invention is given. The difference between the device for measuring the bulk electrical conductivity under the temperature gradient of the dielectric material 1 for satellites and the embodiment 1 lies in the number of metal sheets 2 on the metal layer of the dielectric material 1 to be measured. If there is more than one, the structures of the upper and lower adjacent metal sheets 2 are the same, and the positions are corresponding. like Figure 4 shown, given that each metal layer is Metal sheets 2 arranged in an array. The temperature sensor 8 is arranged in the measured dielectric material 1 on each piece of metal sheet 2 . This embodiment is mainly aimed at the situation where the temperature is three-dimensionally distributed in the medium when the heat source distribution is uneven or the boundary thermal insulation conditions are asymmetrical. That is, by arranging multiple metal sheets 2 on each layer, the three-...

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Abstract

The invention discloses a measurement method for bulk conductivity of a dielectric material for satellites under temperature gradient and a measurement device of the measurement method and relates to the field of dielectric material conductivity measurement devices. The method includes the steps: (a) arranging at least four measurement electrode layers in the dielectric material along the thickness direction by the aid of multilayer printed circuit board processing technology, arranging at least one measurement electrode slice on each measurement electrode layer, enabling two measurement electrode slices, which are vertically adjacent to each other along the thickness direction, identical in structure and corresponding in position to form a pair of measurement electrodes, and arranging a temperature sensor on the dielectric material between the measurement electrodes in each pair; (b) irradiating the upper surfaces of the dielectric material by a light source simulating sunlight so as to enable the dielectric material to have temperature gradient distribution; (c) measuring voltage V and current I between the measurement electrodes in each pair and recording a measuring temperature value of each temperature sensor; (d) computing conductivity of the dielectric material between the measurement electrodes in each pair according to a formula sigma=Id / VS, wherein the S refers to the area of one measurement electrode slice, and the d refers to the distance between the measurement electrodes in each pair along the thickness direction.

Description

technical field [0001] The invention relates to the technical field of dielectric material conductivity measurement devices. Background technique [0002] The on-orbit failure cases of spacecraft tell us that the electrification effect in the medium has become an important potential threat to hinder the highly reliable and long-life operation of the spacecraft. In-spacecraft charging means that high-energy charged particles in space break down the protective layer of the spacecraft, penetrate and deposit inside the medium, thereby causing the medium to generate high potential and strong electric field. Internal charging can easily lead to the degradation of the performance of dielectric materials, interfere with the normal operation of the circuit system, and in severe cases, dielectric breakdown discharge will occur, which is likely to cause permanent failure of the spacecraft. The dielectric conductivity is a key parameter that determines the internal charging effect. The...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R27/02
Inventor 孙永卫曹鹤飞王松武占成杨洁原青云
Owner PEOPLES LIBERATION ARMY ORDNANCE ENG COLLEGE
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