A Photovoltaic Array Fault Diagnosis Method Based on IV Curve Scanning

A photovoltaic array and fault diagnosis technology, applied in photovoltaic modules, photovoltaic power generation, photovoltaic system monitoring and other directions, can solve problems such as short circuits, affecting the power generation efficiency of photovoltaic systems, and reducing the output power of photovoltaic modules

Active Publication Date: 2019-08-06
HOHAI UNIV CHANGZHOU
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Problems solved by technology

[0002] Photovoltaic array is an important part of photovoltaic power generation system. Because it works in a relatively harsh environment for a long time, it will cause open circuit, short circuit, hot spot of the array, and inverter overheating under the influence of factors such as heat, electricity and

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  • A Photovoltaic Array Fault Diagnosis Method Based on IV Curve Scanning
  • A Photovoltaic Array Fault Diagnosis Method Based on IV Curve Scanning
  • A Photovoltaic Array Fault Diagnosis Method Based on IV Curve Scanning

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[0064] In order to enable those skilled in the art to better understand the technical solutions in the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described The embodiments are only some of the embodiments of the present application, but not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without creative efforts shall fall within the protection scope of this application.

[0065] Such as figure 1 As shown, the photovoltaic array fault diagnosis method of the present invention includes four major steps: I: parameter setting and establishment of the array mathematical model; II: online fault pre-judgment; III: fault type identification based on IV curve scanning; IV: fault evaluation . The parameter setting an...

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Abstract

The invention discloses a photovoltaic array fault diagnosis method based on IV curve scanning. The photovoltaic array fault diagnosis method based on a photovoltaic inverter having the IV characteristic curve scanning function contains the following four steps: step A: parameter setting and establishment of an array mathematical model; step B: online fault pre-judgment; step C: fault type identification based on IV curve scanning; and step D: fault assessment. Before performing the fault diagnosis, parameters of the array mathematical model need to be set firstly so as to establish an accurate and adaptive array mathematical model. The invention has the beneficial effects that the photovoltaic array fault diagnosis method provided by the invention can accurately determine faults such as array shadow occlusion, bypass diode short circuit, array open circuit, aging, and inverter MPPT tracking abnormality, and can perform an accurate assessment on faults, thereby providing important information for the operation and maintenance of the power station.

Description

technical field [0001] The invention belongs to the field of photovoltaic power generation and operation and maintenance, and in particular relates to a photovoltaic array fault diagnosis method based on IV curve scanning. Background technique [0002] Photovoltaic array is an important part of photovoltaic power generation system. Because it works in a relatively harsh environment for a long time, it will cause open circuit, short circuit, hot spot of the array, and inverter overheating under the influence of factors such as heat, electricity and external damage. Current, overvoltage, power tube open circuit and other faults seriously affect the power generation efficiency of the photovoltaic system. In addition, partial shading not only reduces the output power of photovoltaic modules, but also becomes one of the causes of failures such as hot spots. In order to avoid serious accidents caused by faults and improve system power generation efficiency, research institutions ...

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Application Information

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IPC IPC(8): H02S50/10
CPCH02S50/10Y02E10/50
Inventor 李元良丁坤陈富东陈翔吴佳兵
Owner HOHAI UNIV CHANGZHOU
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