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Disk life cycle analysis method and device

A life cycle and analysis method technology, applied in the computer field, can solve problems such as increasing disk labor costs and reducing disk performance test results, avoiding data loss or damage, suitable for large-scale application and implementation, and improving test efficiency. Effect

Active Publication Date: 2018-12-07
BEIJING QIHOO TECH CO LTD
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

[0004] However, currently in the process of detecting disk performance, the current disk performance data is usually collected to determine the availability of the current disk, which makes the detection of disk performance have a high lag and increases the risk of data storage; and, the existing In the technology, operation and maintenance or procurement personnel need to manually judge the failure time of the disk, thereby greatly reducing the performance test effect of the disk and increasing the labor cost of disk maintenance

Method used

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  • Disk life cycle analysis method and device
  • Disk life cycle analysis method and device
  • Disk life cycle analysis method and device

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Embodiment Construction

[0025] Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. Although exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be limited by the embodiments set forth herein. Rather, these embodiments are provided for more thorough understanding of the present disclosure and to fully convey the scope of the present disclosure to those skilled in the art.

[0026] figure 1 A schematic flowchart of a disk life cycle analysis method provided according to an embodiment of the present invention is shown. Such as figure 1 As shown, the method includes:

[0027] Step S110, acquiring monitoring index information of the target disk.

[0028] Among them, the target disk is the disk to be analyzed currently, and the monitoring index information includes index information related to the disk ...

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Abstract

The invention discloses a disk life cycle analysis method and device. The method comprises the following steps: obtaining monitoring index information of a target disk; generating a disk wear rate change curve of the target disk according to the monitoring index information; according to the disk wear rate curve of the target disk and the historical disk life cycle data, analyzing the failure timeof the target disk. Through adoption of the scheme, the automatic prediction of disk failure time can be realized, the problem of data loss or damage caused by disk failure can be avoided, the testing efficiency of disk performance can be improved, and the human cost can be greatly reduced. Moreover, the implementation process of the scheme is simple and feasible, and is suitable for large-scaleapplication and implementation.

Description

technical field [0001] The invention relates to the technical field of computers, in particular to a disk life cycle analysis method and device. Background technique [0002] With the continuous development of the information society, all kinds of data show a blowout growth, which requires a large number of storage media to realize the storage of data. The magnetic disk has become one of the important storage media due to its high storage performance, large storage capacity, and high storage reliability. [0003] In the process of using disks to store data, due to normal wear, human operation, and environmental influences of the disks, the disks will fail, resulting in damage or loss of data stored in the disks. Therefore, the detection of disk performance is particularly important. [0004] However, currently, in the process of detecting disk performance, the current disk performance data is usually collected to determine the availability of the current disk, which makes t...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/30
CPCG06F11/3037
Inventor 马智昊张平
Owner BEIJING QIHOO TECH CO LTD