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A photovoltaic array hot spot detection method based on PSO optimized PCNN

A photovoltaic array and detection method technology, applied in image analysis, image enhancement, instruments, etc., can solve the problems of complex parameter setting, undetermined number of iterations, and inability to iterate the fault degree of photovoltaic hot spots, and achieve good segmentation effect

Inactive Publication Date: 2018-12-11
CHONGQING UNIV
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  • Abstract
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Problems solved by technology

However, this method has some defects: a. In practical applications, the parameter setting of this method is complicated and difficult to debug; b. The number of iterations cannot be determined, that is, it is impossible to perform appropriate iterations for the failure degree of photovoltaic hot spots, etc.

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  • A photovoltaic array hot spot detection method based on PSO optimized PCNN
  • A photovoltaic array hot spot detection method based on PSO optimized PCNN
  • A photovoltaic array hot spot detection method based on PSO optimized PCNN

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Embodiment Construction

[0058] The preferred embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings; it should be understood that the preferred embodiments are only for illustrating the present invention, rather than limiting the protection scope of the present invention.

[0059] figure 1 It is a flow chart of a photovoltaic array hot spot detection method based on PSO optimized PCNN, figure 2 For the comparison between the R component and the B component of the original RGB image, and the image after R component image processing, image 3 The flow chart of PCNN hot spot segmentation algorithm based on PSO optimization, Figure 4 Infrared thermal image after segmentation for the hot spot effect of the photovoltaic panel, as shown in the figure: a kind of photovoltaic array hot spot detection method based on PSO optimization PCNN provided by the present invention comprises the following steps:

[0060] S1: Preprocessing the original ima...

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Abstract

The invention discloses a photovoltaic array hot spot detection method based on a PSO optimized PCNN, belonging to the photovoltaic power generation field. Firstly, the R component in RGB color spaceis used to process the image, and then the region of photovoltaic array is extracted by shape feature recognition. Secondly, the image is transformed from RGB to HSV color space, and the hot spot region of S component image in HSV space is segmented by PCNN algorithm. For a PCNN algorithm, the maximum entropy criterion is used to determine the number of iterations, and particle swarm optimization(PSO) is used to optimize its parameters, which simplifies the operation process and improves the effect of segmentation.

Description

technical field [0001] The invention relates to the field of fault detection of photovoltaic power generation systems, in particular to a method for detecting hot spots of photovoltaic arrays based on PSO optimized PCNN. Background technique [0002] In recent years, due to the prominence of energy and environmental issues, the global new energy industry has developed rapidly. Vigorously developing renewable energy has become an important energy strategy in my country. However, during the operation of the photovoltaic power generation system, the partial shading of the components will affect the output of the photovoltaic power generation system and produce a "hot spot effect". In severe cases, it may even cause damage to the photovoltaic cells. Therefore, it is necessary to detect hot spot faults in photovoltaic power generation systems. [0003] Hot spot effect is a major failure phenomenon that is prone to occur during the operation of photovoltaic panels. Specifically...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06T7/11G06T7/90
CPCG06T7/0008G06T2207/10048G06T2207/20084G06T2207/30164G06T7/11G06T7/90
Inventor 毛明轩奚鑫泽万怡浩郭珂周林刘强周思宇张前进解宝郝高峰李海啸吴昊
Owner CHONGQING UNIV
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