A test system and method for tracing an exception causing a memory overflow

A memory overflow and testing system technology, applied in the computer field, can solve problems such as memory overflow exceptions, achieve the effects of improving stability, improving testing methods and analysis efficiency, and improving product quality

Inactive Publication Date: 2018-12-18
ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
View PDF7 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The present invention provides a test system and method for tracking the abnormalities caused by memory overflow, which are used to solve the problems in the prior art

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A test system and method for tracing an exception causing a memory overflow
  • A test system and method for tracing an exception causing a memory overflow
  • A test system and method for tracing an exception causing a memory overflow

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0024] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments.

[0025] This embodiment discloses a test system for tracking abnormalities caused by memory overflow. The test system includes: a sending module, a data collection module and a data analysis module.

[0026] Among them, the sending module is used to send the tracking script code to the server, and the tracking script code obtains the server memory usage information data; the data collection module includes a storage overflow collection unit and a memory allocation application overflow unit, which is used to record and generate data memory overflow Du...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

A test system and method for tracing an exception causing a memory overflow are provided. The test system includes a sending module for sending a tracing script code to a server, the tracing script code obtaining server memory usage information data; a data collection module which comprises a storage overflow collection unit and a memory allocation application overflow unit, wherein the storage overflow collection unit and the memory allocation application overflow unit are used for realizing a data memory overflow record and generating a Dump file; a data analysis module which processes the Dump file through the memory analysis tool to obtain the memory overflow information data. The invention is helpful to improve the testing means and analysis efficiency of the memory component. Compared with the prior method, the invention can improve the exception diagnosis efficiency of the memory overflow by more than 20% through statistics and comparison. The invention facilitates management and checking and more comprehensive and systematic server operation condition detection and diagnosis; the invention improves the quality of server products, and the system is more stable and sound.

Description

technical field [0001] The invention belongs to the technical field of computers, and in particular relates to a test system and method for tracking abnormalities caused by memory overflow. Background technique [0002] Server Server has gradually replaced traditional minicomputers, running and carrying core applications. When the server processes a large amount of business data, different data processing processes will occupy and use memory, and some data processes often cause memory overflow exceptions. [0003] Memory overflow (Out Of Memory) is a kind of problem that has a great impact on the running performance of the server and is difficult to diagnose. Because the server causes the memory overflow thread lock to continue to work, the operation of other threads applying for memory can only be in a waiting state, which seriously affects the performance of the server. If there is no normal response from the server, the server will fall into an endless loop of memory ov...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/07G06F11/36
CPCG06F11/0778G06F11/079G06F11/3636G06F11/366
Inventor 邢科钰
Owner ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products