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Device and method for determining flicker frequency of radiation wave source

A flicker frequency and radiation wave technology, which is applied in measuring devices, optical instrument testing, optical performance testing, etc., achieves the effects of increased upper limit of precision, wide application prospects, and simple operation

Active Publication Date: 2018-12-21
湖南袁禾农业科技有限公司
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  • Summary
  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

[0005] In order to improve the measurement accuracy of the flicker frequency of the radiation wave source and solve the problem of detecting the flicker frequency of the radiation wave source, the application provides a device and method for measuring the flicker frequency of the radiation wave source, and the upper limit of the accuracy can be increased by more than 100 times compared with the prior art

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  • Device and method for determining flicker frequency of radiation wave source
  • Device and method for determining flicker frequency of radiation wave source
  • Device and method for determining flicker frequency of radiation wave source

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Embodiment Construction

[0031] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the application and together with the description serve to explain the principles of the application.

[0032] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the drawings that need to be used in the description of the embodiments or the prior art. Obviously, for those of ordinary skill in the art, In other words, other drawings can also be obtained from these drawings without paying creative labor.

[0033] Please refer to the attached figure 1 , which shows a schematic structural diagram of a device for measuring the scintillation frequency of radiation waves provided by an embodiment of the present application.

[0034] The device for measuring the flicker frequency of a radiation wave source provided in the present appl...

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Abstract

The invention provides a device and method for determining the flicker frequency of a radiation wave source. The device comprises a detection gyroscope and a control box; a control unit and a motor for driving the detection gyroscope to rotate are arranged in the control box, and a rotating shaft of the motor is connected with a rotating shaft of the detection gyroscope; the detection gyroscope comprises a rotating disc, a fan section is arranged on the upper disc face of the rotating disc, a strong absorbing medium for radiation waves is adopted as a surface layer material of the upper disc surface, and a weak absorbing and scattering medium for the radiation waves is adopted as a surface layer material of the fan section; and a rotating speed detection unit is installed on the lower surface of the rotating disc and connected with the control unit. Fourier transform for transforming time information of the radiation wave source into space information is achieved by means of fan spokesrotating at a high speed, the test precision of the flicker frequency of the radiation wave source can be effectively improved, the device is suitable for flicker frequency determination of multiplevisible or invisible radiation wave sources including sunlight, and the precision upper limit of the device can be improved by 100 times or above. The device has the advantages that operation is easy,to-be-detected radiation wave sources are not limited, and the application prospect is wide.

Description

technical field [0001] The present application relates to the technical field of measuring the frequency of radiation wave sources, in particular to a device and method for measuring the scintillation frequency of radiation wave sources. Background technique [0002] The flickering of the radiation wave source means that the radiation wave emitted by the radiation wave source changes rapidly and repeatedly over time, making the radiation wave source beating and unstable. Taking the common light source in daily life as an example, in addition to intermittent changes in the light source flickering, there are also periodic changes in the frequency, intensity, and certain sub-item physical parameters of light, which are all light source flickering . Of course, the human naked eye cannot easily detect the flickering of the radiation wave source. When the flickering frequency is greater than 24 times per second, it is regarded as a continuous radiation wave source due to the pers...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01D21/00G01M11/02
CPCG01D21/00G01M11/00
Inventor 胡爱生胡心宇
Owner 湖南袁禾农业科技有限公司