Massive UI test generation method and device based on buried point data
A technology of test generation and point data, which is applied in the direction of program control device, electrical digital data processing, software testing/debugging, etc., and can solve problems such as poor simulation degree
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[0033] The present invention will be further described in detail below in conjunction with the accompanying drawings and examples. The following examples are explanations of the present invention and the present invention is not limited to the following examples.
[0034] Such as figure 1 As shown, this massive UI test generation method based on buried point data includes: buried point data modeling, user data collection; result reverse check, to obtain a platform-independent test case model; UI test case generation, buried point data Data output from modeling and result backchecks as test cases
[0035] Specifically, in the buried point data modeling here, the user behavior probability histogram and the dwell time probability histogram are obtained; the user behavior probability histogram and the dwell time probability histogram here are for unified user behavior; the buried point here The collection of user data in data modeling includes the capture, processing, transmissi...
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