Massive UI test generation method and device based on buried point data

A technology of test generation and point data, which is applied in the direction of program control device, electrical digital data processing, software testing/debugging, etc., and can solve problems such as poor simulation degree

Active Publication Date: 2018-12-28
挖财网络技术有限公司
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  • Abstract
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Problems solved by technology

[0006] In view of this, the purpose of the present invention is to address the above problems, to provide a mass UI test generation method and device based on buried point data, in order to solve the problem in the prior art that requires software testers to h

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  • Massive UI test generation method and device based on buried point data
  • Massive UI test generation method and device based on buried point data
  • Massive UI test generation method and device based on buried point data

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[0033] The present invention will be further described in detail with reference to the accompanying drawings and embodiments. The following embodiments are for explaining the present invention and the present invention is not limited to the following embodiments.

[0034] Such as figure 1 As shown, this massive UI test generation method based on buried point data includes: buried point data modeling, collecting user data; reverse inspection results to obtain platform-independent test case models; UI test case generation, and buried point data Data output as a test case during modeling and reverse inspection of results

[0035] Specifically, in the buried point data modeling here, the user behavior probability histogram and the stay time probability histogram are obtained; the user behavior probability histogram and stay time probability histogram here are for unified user behavior; the buried point here Collecting user data in data modeling includes capturing, processing, sending ...

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Abstract

The invention provides a massive UI test generation method based on buried point data and a device thereof, belonging to the technical field of software test. The invention solves the problems of irrational design of the prior art and the like. The invention relates to a mass UI test generation method and a device thereof based on buried point data, which comprises the following steps: buried point data is modeled and user data is collected; the platform-independent test case model is obtained by result backward checking; UI test cases are generated, and the data output from buried point datamodeling and result reverse check is used as test cases. The advantages of the mass UI test generation method based on buried point data and the device thereof are that the problem that the PIT overlyrelies on the PIM is solved, and the PIT can simulate the user behavior to a high degree.

Description

technical field [0001] The invention belongs to the technical field of software testing, and in particular relates to a mass UI test generation method based on buried point data and a device thereof. Background technique [0002] With the rapid development of the mobile Internet, the competition among Internet products has become increasingly prominent. Therefore, the ease of use and stability of Internet products will become one of the important considerations for the public to choose the product. The UI-based test method is the test scheme closest to the user group, which can more intuitively observe whether the product is stable during use. Therefore, even back-end testers will use UI testing methods as an important functional verification solution in regression testing, but due to personnel and time constraints, the existing UI-based test verification methods have few cases and consume a lot of time. Sometimes it is impossible to simulate the actual usage of various re...

Claims

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Application Information

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IPC IPC(8): G06F11/36G06F9/451
CPCG06F11/3688G06F9/451
Inventor 陈程陈丽娟孙雪清
Owner 挖财网络技术有限公司
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