A bit error testing device and testing method thereof

Abstract

The invention relates to a bit error testing device and a testing method thereof, comprising a user terminal, a control module, a detection module, a clock crystal oscillator module, a signal shaping module and an optical module; the user terminal is used to send operation instructions to the detection module through the control module; the clock crystal oscillator The module is used to generate the first reference clock or the Nth reference clock; the detection module is used to start the system initialization according to the first reference clock, and the system starts the first working mode by default, and performs the first bit error test or the Nth error Code test, send the corresponding pseudo-random code sequence to the optical module; it is also used to receive the operation result sent by the optical module, and collect error data; the optical module is used to receive the pseudo-random code sequence, and send the operation result to the detection module after operation. The invention has the beneficial effects of low hardware cost, simple operation, high error code detection efficiency, and can be used for error code detection of optical communication products with various rates, thereby reducing production cost.

Description

technical field [0001] The invention relates to the technical field of optical communication, in particular to a bit error testing device and a testing method thereof. Background technique [0002] At present, there are many bit error test devices on the market, but they are all point frequency, which cannot realize continuous arbitrary rate and multi-rate bit error test, and the performance cannot satisfy all customers in this frequency band. It is necessary to buy multiple devices, and the hardware cost is wasteful. Moreover, in the process of automated production, different devices must be programmed separately, which increases the development cycle and cost. Contents of the invention [0003] The technical problem to be solved by the present invention is to provide a bit error testing device and a testing method thereof for the defects of the prior art. [0004] The technical scheme that the present invention solves the problems of the technologies described above is ...

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Problems solved by technology

[0002] At present, there are many bit error test devices on the market, but they are all point frequency, which cannot realize continuous arbitrary rate and multi-rate bit error test, and the performance cannot satisfy all customers in this frequency band. It is necessary to buy multiple devices, and the hardware cost is wasteful. Moreover, in the process of automated production, different devices must be programmed separately, which increases the development cycle and cost

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