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An application test method and device

A technology for application testing and equipment, applied in the field of application testing methods and equipment, can solve the problems of cumbersome debugging process, low testing efficiency, long time consuming, etc., and achieve the effect of improving testing efficiency, using less time, and being easy to read

Inactive Publication Date: 2019-02-19
SHANGHAI CHUANGGONG COMM TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

The debugging process is cumbersome, and if more algorithms are involved, the code needs to be recompiled when testing the parameters of each algorithm, which takes a long time and the test efficiency is low

Method used

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  • An application test method and device

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Embodiment Construction

[0059] In order to make the purpose, technical solutions and advantages of the present invention clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application.

[0060] At present, the test application needs to find the relevant algorithm-related codes involved, modify the parameters configured in its header file, recompile and generate a new library file, and then test the application through the library file. If more algorithms are involved, the parameter test of each algorithm needs to recompile the code, which takes a long time and the test efficiency is low.

[0061] An embodiment of the present application provides an application testing method. When testing an application, testing is performed based on test parameters in a configured test file. Since the test parameters in the test file can be directly read, there is no need to w...

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Abstract

The invention discloses an application test method and device, which are used for improving test efficiency. The application testing method comprises the following steps: receiving an input test instruction for testing the application; obtaining a first test file from a plurality of test files stored in advance according to the test instruction, wherein the first test file is used for testing a first function of the application, and the test file indicates a test parameter for testing a function and value information corresponding to the test parameter; testing the first function according toa value of a test parameter in the first test file.

Description

technical field [0001] The invention relates to the technical field of application debugging, in particular to an application testing method and equipment. Background technique [0002] With the development of the mobile Internet, various applications such as camera applications are produced. Usually, when developers debug the shooting effect of the camera application, they transplant the third-party camera algorithm and configure all the algorithm parameters in the defined .h header file. When debugging the camera's photo effect, you need to find the algorithm-related code involved, modify the parameters configured in its header file, and recompile to generate a new library file. The debugging process is cumbersome, and if more algorithms are involved, the code needs to be recompiled when testing the parameters of each algorithm, which takes a long time and the test efficiency is low. Contents of the invention [0003] Embodiments of the present application provide an a...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
CPCG06F11/362
Inventor 余涛吴明天张腾
Owner SHANGHAI CHUANGGONG COMM TECH