Method and device for estimation of device reliability

A reliability and device technology, applied in the field of measurement and analysis, can solve the problems of large number of reliability tests, high test costs, long test time, etc.

Inactive Publication Date: 2019-03-01
GREE ELECTRIC APPLIANCES INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

In the existing technology, the number of reliability tests is huge, the test cost is high, and the test time of some test items is long, which can exceed hundreds of hours

Method used

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  • Method and device for estimation of device reliability
  • Method and device for estimation of device reliability
  • Method and device for estimation of device reliability

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Embodiment Construction

[0043] In order to make the objectives, technical solutions and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all of them. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the protection scope of the present invention.

[0044] figure 1 Exemplarily shows a system architecture applicable to the method for estimating device reliability provided by an embodiment of the present invention. The system architecture may be a withstand voltage testing system 100, which includes a heating device 101, a testing device 102, High-voltage source 103, signal collection device 104, signal processing device 105. Among them, a device to be tested is placed in the testing d...

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Abstract

The present invention discloses a method and a device for estimation of device reliability. The method comprises the steps of: obtaining a test temperature set of a device to be tested, wherein the test temperature set comprises a plurality of test temperatures; according to the test temperatures, adding a voltage to the device to be tested, and estimating the reliability of the device to be tested. The technical scheme can preset the test temperature set of the device to be tested and adds the voltage to the device to be tested according to the test temperatures in the test temperature set toestimate the reliability of the device to be tested in the plurality of test temperatures so as to detect non-performing products in the power device in advance and improve the efficiency of reliability test.

Description

Technical field [0001] The embodiment of the present invention relates to measurement and analysis technology, and in particular to a method and device for estimating device reliability. Background technique [0002] Insulated Gate Bipolar Transistor (IGBT) is a core technology in the fields of variable frequency home appliances and new energy vehicles. Its production process is complex and powerful, and it plays an important role in variable frequency home appliances. Therefore, the reliability requirements for IGBT power devices are very high. After the IGBT tape-out packaging is completed, a series of environmental life tests and reliability tests are required. In the prior art, the number of reliability tests is huge, the test cost is high, and the test time of some test items is longer, which can exceed hundreds of hours. [0003] Before performing reliability testing on power devices, it is necessary to estimate its reliability and detect defective products in power devices...

Claims

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Application Information

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IPC IPC(8): G01R31/26
CPCG01R31/2603G01R31/2642
Inventor 刘勇强史波敖利波
Owner GREE ELECTRIC APPLIANCES INC
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