A kind of power amplifier reliability test method and test system

Abstract

The invention discloses a power amplifier reliability test method and a test system, comprising: randomly extracting power amplifiers from the power amplifiers to be tested to perform a consistency test, and performing a temperature reliability test on the power amplifiers that pass the consistency test among the extracted power amplifiers Test, conduct a performance stability test on the power amplifier that has passed the temperature reliability test, and obtain the stability deviation; randomly select a power amplifier with a set ratio from the standard performance stability test group, and conduct a limit performance stability test. The test group randomly selects power amplifiers with a set ratio, and conducts standard performance stability tests. If the stability of the limit performance of the power amplifier is reliable and the stability of the standard performance of the power amplifier is reliable, the performance of the power amplifier is reliable. Otherwise, the performance of the power amplifier is unreliable. Through the invention, the power amplifier to be tested can be accurately and digitally tested effectively, and the reliability test efficiency is improved.

Description

technical field [0001] The invention relates to the communication field, in particular to a power amplifier reliability test method and a test system. Background technique [0002] Usually the chip needs to go through a comprehensive test during the development process. The reliability test of the existing chip is in the test process. In order to test whether there is a quality problem in the module to be tested, it is necessary to perform a functional inspection as required, and cycle many times until the reliability test is completed. The existing test process is very cumbersome. The workload of personnel is heavy, and it is difficult to maintain precise control of reliability testing for a long time. Therefore, how to complete chip reliability testing more efficiently and accurately is a topic that researchers need to study at present. Contents of the invention [0003] The purpose of the present invention is to overcome the deficiencies in the prior art, a kind of pow...

AI Technical Summary

Problems solved by technology

The reliability test of the existing chip is in the test process. In order to test whether there is a quality problem in the module to be tested, it is necessary to perform a functional inspection as required, and cycle many times until the reliability test is completed. The existing test process is very cumbersome. The workload of the personnel is heavy, and it is difficult to maintain precise control of the reliability test for a long time. Therefore, how to complete the reliability test of the chip more efficiently and accurately is a topic that researchers need to study at present.

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