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Infrared scanning control method and circuit and electronic device

A technology of infrared scanning and control method, which is applied to the input/output process of electrical digital data processing, instruments, and data processing, etc., can solve the problems of waste of MCU resources, slow scanning frame rate, etc., and save the time of delay and waiting. , Improve the scanning frame rate and save the effect of resource consumption

Inactive Publication Date: 2019-03-08
GUANGZHOU HUAXIN ELECTRONICS TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The existing technology is to control the output of 74HC164 and 74HC138 by simulating the corresponding control timing through the GPIO (general-purpose input and output pin) pin of the MCU. The software control process can refer to figure 2 , because it is necessary to meet the timing requirements of the logic device, the turn-on time required by the scanning circuit and the time limit for ADC conversion, in the main process of control, the time requirements of each stage must be met by delaying and waiting. The process of delaying and waiting for MCU resources are wasted
At the same time, the entire scanning process is mainly composed of two parts: scanning control, data sorting and transmission, and these two parts can only be executed serially. It is necessary to wait for the scanning data to end before sending data, and the scanning frame rate is relatively slow.

Method used

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  • Infrared scanning control method and circuit and electronic device
  • Infrared scanning control method and circuit and electronic device
  • Infrared scanning control method and circuit and electronic device

Examples

Experimental program
Comparison scheme
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Embodiment 1

[0028] see image 3 , image 3 It is a flow chart of an infrared scanning control method provided by an embodiment of the present invention; including:

[0029] S1. When responding to the start command, the timer starts scanning, and triggers the infrared transmitting and receiving circuit to start working with an output control signal;

[0030] S2. The timer sends an enable signal to the ADC module when scanning, so that the ADC module starts sampling data;

[0031] S3. Send the sampling data of the ADC module.

[0032] Wherein, the timer and the ADC module are integrated in one MCU, and the MCU may be an MCU of STM32 series or GD series, such as: STM32F1xx, STM32F3xx, STM32F4xx, STM32H7xx of STM32 series, GD405 of GD series, etc.

[0033] Preferably, when responding to the initialization command, it is necessary to configure the timing of the PWM channel in the timer, and this step is only performed once when the system is initialized. The MCU includes several timers, se...

Embodiment 2

[0040] see Figure 5 , Figure 5 It is a structural block diagram of an infrared scanning control circuit 10 provided by an embodiment of the present invention; the infrared scanning control circuit 10 includes an infrared transmitting and receiving circuit 11 and an MCU12; wherein, the MCU12 executes the infrared scanning described in the first embodiment above In the control method, the MCU 12 includes a timer 121 , an ADC module 122 and a DMA controller 123 .

[0041] Specifically, when the timer 121 responds to the start command, it starts to output the PWM waveform to generate the required control sequence to control the scanning, and triggers the infrared transmitting and receiving circuit 11 to start working by outputting a control signal. In this process, the entire scanning process basically does not require the intervention of the MCU12 (the GPIO port of the MCU12 is not required to realize control), so that the resources of the MCU12 can be used to organize and sen...

Embodiment 3

[0046] see Figure 6 , Figure 6 It is a structural block diagram of an electronic device 20 provided by an embodiment of the present invention; the electronic device 20 includes a main circuit 21 and the infrared scanning control circuit 10 described in the above embodiment; wherein, the infrared scanning control circuit 10 combines the The sampling data of the ADC module is sent to the main circuit 21, so that the main circuit 21 locates the position of the touching object according to the sampling data.

[0047] Preferably, the electronic device 20 further includes a touch screen, and the touch screen is used for receiving a touch signal of the touch object. For the specific working process of the infrared scanning control circuit 10 , please refer to the working process of the infrared scanning control circuit 10 in the second embodiment, which will not be repeated here.

[0048] Compared with the prior art, the electronic device 20 disclosed in the present invention sol...

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Abstract

The invention discloses an infrared scanning control method, which is characterized by being suitable for an infrared transmitting and receiving circuit, and the method comprises the following steps of when a starting instruction is responded, using a timer to start to scan to output a control signal to trigger the infrared transmitting and receiving circuit to start to work; when the timer is used for scanning, sending the enabling signals to the ADC module, so that the ADC module starts to sample data; sending the sampling data of the ADC module, wherein the timer and the ADC module are integrated in an MCU. The embodiment of the invention also discloses an infrared scanning control circuit and an electronic device. By adopting the embodiment of the invention, the resource consumption ofthe MCU can be saved, the scanning control and the data transmission can be carried out in parallel, and the scanning frame rate is improved.

Description

technical field [0001] The invention relates to the technical field of infrared circuit control, in particular to an infrared scanning control method, circuit and electronic equipment. Background technique [0002] Infrared touch frame emitter light scanning control circuit such as figure 1 As shown, the designated infrared emission lamps are turned on through the row selection control lines V0~V7 and the column selection control lines H0~H5. Among them, the row selection control signal is output by MCU through controlling 74HC164, and the column selection signal is output by MCU controlling 74HC138. The existing technology is to control the output of 74HC164 and 74HC138 by simulating the corresponding control timing through the GPIO (general-purpose input and output pin) pin of the MCU. The software control process can refer to figure 2 , because it is necessary to meet the timing requirements of the logic device, the turn-on time required by the scanning circuit and the...

Claims

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Application Information

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IPC IPC(8): G06F3/041G06F3/042
CPCG06F3/0412G06F3/042
Inventor 吴称列刘军刚黄俊斌
Owner GUANGZHOU HUAXIN ELECTRONICS TECH