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A CMOS image sensor structure and method for preventing scribe short circuit

An image sensor and dicing technology, which is applied in the direction of circuits, semiconductor devices, electric solid devices, etc., can solve problems such as functional failure and chip quiescent current rise

Active Publication Date: 2021-05-18
上海微阱电子科技有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, if the silicon residue sinter 10' remains on the side of the chip, due to the conductive effect of the silicon residue sinter, the n-type substrate used on the photosensitive chip side and the p-type substrate on the logic chip side will be short-circuited together to form A short-circuit path 15 from the power supply to the ground, resulting in an increase in the quiescent current of the chip and even a failure of the function

Method used

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  • A CMOS image sensor structure and method for preventing scribe short circuit
  • A CMOS image sensor structure and method for preventing scribe short circuit
  • A CMOS image sensor structure and method for preventing scribe short circuit

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Embodiment Construction

[0051] The specific embodiment of the present invention will be further described in detail below in conjunction with the accompanying drawings.

[0052] It should be noted that, in the following specific embodiments, when describing the embodiments of the present invention in detail, in order to clearly show the structure of the present invention for the convenience of description, the structures in the drawings are not drawn according to the general scale, and are drawn Partial magnification, deformation and simplification are included, therefore, it should be avoided to be interpreted as a limitation of the present invention.

[0053] In the following specific embodiments of the present invention, please refer to Figure 3-Figure 5 , image 3 It is a schematic plan view of the structure of a CMOS image sensor for preventing scribe short circuit according to a preferred embodiment of the present invention, Figure 4 It is a schematic cross-sectional view of a CMOS image se...

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Abstract

The invention discloses a CMOS image sensor structure and formation method for preventing dicing short circuit. By arranging a composite isolation structure outside the internal circuit regions of a photosensitive chip and a logic chip, it includes a P-well implant formed in an n-type substrate of the photosensitive chip. region, the first P+ implantation region, the third metal interconnection layer structure, the fourth metal interconnection layer, the second P+ implantation region formed in the logic chip, and the combination of the third metal interconnection layer and the fourth metal interconnection layer The TSV structure with upper and lower electrical connection realizes the electrical connection between the p-type substrate of the logic chip and the P-well injection region in the n-type substrate of the photosensitive chip, and isolates the pixel unit in the n-type substrate for photosensitive The array area and the peripheral suspended n-type substrate area, when the silicon residue sinter formed by dicing forms residues on the sidewalls of the stacked chips, it only connects the suspended n-type substrate area and the p-type substrate, and does not Causes a short circuit from the power supply to ground or an increase in quiescent current.

Description

technical field [0001] The present invention relates to the technical field of CMOS image sensors, and more particularly, relates to a three-dimensional stacked CMOS image sensor structure and forming method that can prevent short circuit problems during silicon wafer scribing. Background technique [0002] An image sensor refers to a device that converts optical signals into electrical signals. Large-scale commercial image sensor chips include charge-coupled device (CCD) and complementary metal-oxide semiconductor (CMOS) image sensor chips. Compared with traditional CCD sensors, CMOS image sensors have the characteristics of low power consumption, low cost and compatibility with CMOS technology, so they are more and more widely used. CMOS image sensors are now not only used in consumer electronics such as miniature digital cameras (DSC), mobile phone cameras, video cameras and digital single-lens reflex cameras (DSLR), but also in automotive electronics, monitoring, biotech...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L27/146
CPCH01L27/146H01L27/1463H01L27/14636H01L27/14683H01L27/14698
Inventor 顾学强
Owner 上海微阱电子科技有限公司