Carrier rocket test data interpretation method and system based on formalized description

Abstract

The invention discloses a formalized description-based carrier rocket test data interpretation method and system. The method comprises the following steps: (1) classifying criteria of test parameters;(2) defining composition elements of a test parameter criterion; (3) according to the defined composition elements, carrying out formalized description on the classified criteria; (4) reading formalized description of the criterion, and converting an interpretation rule represented by the formalized description into a target program code which can be identified by a computer; And (5) operating the target program code by taking the carrier rocket test data as a data source, and giving an interpretation conclusion about whether the carrier rocket test data is normal or not, thereby completing interpretation of the carrier rocket test data. Through the formalized description method, the problem that the criteria of the test data of the carrier rocket are difficult to accurately describe anddefine is solved, automatic test data interpretation is realized on the basis, and the test data interpretation efficiency and accuracy are greatly improved.

Description

Technical field [0001] The invention relates to a method and system for interpreting test data of a launch vehicle based on formal description, and belongs to the field of data processing and application of launch vehicles. Background technique [0002] System testing is an important part of the launch vehicle test and launch process. The completeness and correctness of test data is an important basis and index for evaluating the performance and reliability of launch vehicles, and it is also an important basis for professionals to make judgments and decisions. With the continuous development of launch vehicle technology, the amount of data generated by system testing has exploded. The main features are multiple types of data, high density, and long data duration. The test data involves thousands or even tens of thousands of parameters. The collection density of each parameter is large, and the collection frequency ranges from 50Hz to 500Hz. [0003] During each system test or aft...

AI Technical Summary

Problems solved by technology

[0010] The technical problem to be solved by the present invention is: to overcome the deficiencies of the existing means, to propose a method and system for interpreting test data of launch vehicles based on formal description, and to solve the problem that the criterion of test data of launch vehicles is difficult to be accurate through the method of formal description The problem of description and definition, on this basis, the automatic test data interpretation is realized, which greatly improves the efficiency and accuracy of test data interpretation

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