Supercharge Your Innovation With Domain-Expert AI Agents!

K series fpga internal clb module positioning and general configuration test method

A configuration testing and universal technology, applied in the field of FPGA testing, can solve the problems of complicated configuration program design, difficult to locate CLB array, poor configuration program portability, etc. Effect

Active Publication Date: 2021-07-27
SHANGHAI PRECISION METROLOGY & TEST RES INST +1
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The object of the present invention is to provide K7 series FPGA internal CLB module location and universality configuration test method, to solve the CLB array existence " cavity " is difficult to locate and configuration program design complexity, the poor problem of configuration program portability

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • K series fpga internal clb module positioning and general configuration test method
  • K series fpga internal clb module positioning and general configuration test method
  • K series fpga internal clb module positioning and general configuration test method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0020] Taking the 7K410T-1FFG9000 (a high-end FPGA product produced by Xilinx) with a wide range of applications as an example, the specific design and built-in self-test are carried out. The specific steps are as follows.

[0021] Step 1, CLB module array positioning.

[0022] Find the specific location of the hole, for example, the first hole on the left is: SLICE_X24Y100-SLICE_X24Y199, SLICE_X35Y100-SLICE_X35Y199.

[0023] Because the address of the "hole" array is less, the design of inverting the address of the hole array is adopted to optimize the program. For the convenience of understanding, define X LL Y LL It is the position of the lower left corner of the first hole array, that is, SLICE_X24Y100, and other positions are the same as X LL The operation is similar.

[0024] figure 2 It is a schematic flowchart of a CLB module positioning program provided by Embodiment 1 of the present invention. refer to figure 2 ,

[0025] a. First locate the X0 and Y0 addres...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The present invention provides K7 series FPGA internal CLB module positioning and universal configuration testing method, including: positioning the specific position of all CLB modules inside the FPGA; performing left and right equal divisions on the CLB module array, and in each equal division, the CLB modules of the same row are parallel, and the CLBs of the same column Modules are configured serially to achieve full coverage of CLB resources; the built-in self-test is performed on the configured CLB module array, and by comparing the actual output data with the expected data, it is judged whether there is a defect in the CLB module array. The problem is to locate the specific location of the CLB module error according to the corresponding relationship between the output signal and the clock. The K7 series FPGA internal CLB module positioning and universal configuration testing method provided by the present invention realizes the positioning of all CLB modules without calculating the specific position of the "hole" array, optimizes the configuration program, and realizes the optimal configuration times and configuration program It is versatile and reduces the time for repeated program writing.

Description

technical field [0001] The present invention relates to the technical field of FPGA testing, in particular to K7 series FPGA internal CLB module positioning and universal configuration testing methods. Background technique [0002] Kintex-7 series FPGA is a high-end FPGA product developed by Xilinx. It is widely used in 3G / 4G wireless, flat panel display, Video, aerospace systems, etc. FPGA is mainly composed of programmable logic unit (CLB), input and output unit (IOB), 90% of the logic resource functions in the FPGA are realized by the CLB module, so the CLB module test occupies an important position in the FPGA test. However, the CLB module array of the K7 series FPGA is different from Xilinx's previous Virtex4 and Virtex5 series FPGAs. Its distribution is asymmetrical and has "holes", which require precise positioning of the CLB module array. [0003] For the "hole" CLB array, the traditional configuration program has two methods, adopting an all-serial architecture or ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/3185
CPCG01R31/318519
Inventor 王立恒项宗杰徐导进
Owner SHANGHAI PRECISION METROLOGY & TEST RES INST
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More