Circulating liquid type suction head and method for removing particles in wafer
A technology for circulating liquids and wafers, which is applied in semiconductor/solid-state device manufacturing, electrical components, circuits, etc., and can solve problems such as difficult removal of particles
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[0021] Such as image 3 As shown, this embodiment involves a circulating liquid suction head for wafer cleaning, including a nozzle 2 and a suction nozzle 1, the nozzle 2 continuously ejects liquid, and then, under the action of external pressure, the The suction nozzle 1 sucks the ejected liquid away.
[0022] Preferably, the suction nozzle 1 is located at the center, and the ring-shaped nozzle 2 surrounds the outside of the suction nozzle 1 to form a circulating liquid suction head with an integrated structure.
[0023] A negative-pressure method for cleaning particles in a wafer according to this embodiment specifically includes the following steps:
[0024] (A1) Determine the cleaning strategy: the wafer inspection system detects the particle coordinates in the wafer to obtain the number and distribution of particles on the wafer, and then imports the particle coordinates into the vertical cleaning system, which compares the particle distribution map with the integrated c...
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