Test case generation method and device and server
A test case generation and test case technology, applied in the computer field, can solve problems such as low efficiency, long time consumption, and large amount of test data, and achieve the effect of improving efficiency, reducing time consumption, and shortening the cycle.
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[0040] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0041] see figure 1 , figure 1 It is a flow chart of the test case generation method provided by the embodiment of the present invention. The method can be applied to electronic equipment. The electronic equipment can be user equipment with data processing capabilities such as notebook computers and PCs (personal computers). Obviously, the e...
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