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Surface Measurement System

A technology for measuring and measuring objects, which is applied in the direction of measuring devices, instruments, and optical devices, etc., and can solve the problems of increasing the light source intensity of the exposure time, signal misjudgment, and measurement.

Active Publication Date: 2021-04-09
致茂电子(苏州)有限公司
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  • Application Information

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Problems solved by technology

However, transparent materials have the problem of low reflectivity. To obtain a sufficiently accurate image, it is necessary to increase the exposure time and / or light source intensity of the measurement
If there is a defect inside or at the bottom of the component, it may also be measured, resulting in misjudgment of the signal
In addition, if the surface of the component is a curved surface, multiple reflections will also occur

Method used

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Embodiment Construction

[0022] A number of embodiments of the present invention will be disclosed below with the accompanying drawings. For the sake of clarity, many practical details will be described together in the following description. It should be understood, however, that these practical details should not be used to limit the invention. That is, in some embodiments of the present invention, these practical details are unnecessary. In addition, for the sake of simplifying the drawings, some known and conventional structures and elements will be shown in a simple and schematic manner in the drawings.

[0023] figure 1 It is a schematic diagram of a surface measurement system 100 according to an embodiment of the present invention. The surface measurement system 100 is used for measuring an object 900 having a low reflection surface 910 . The surface measurement system 100 includes a condensation device 110 and a measurement device 160 . The dew condensation device 110 is used to form a liqu...

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Abstract

A surface measurement system is used to measure a test object with a low-reflection surface. The surface measurement system includes a condensation device and a measurement device. The condensation device is used to form a liquid layer on the surface of the object to be tested. The dew condensation device includes a cavity, a temperature control gas source and a humidification gas source. The cavity is used to accommodate the object to be tested. The temperature-controlling gas source is connected to the cavity for providing temperature-controlling gas into the cavity to control the temperature of the object to be tested. The humidifying gas source is connected to the cavity for supplying moisture into the cavity to form a liquid layer on the surface of the object to be tested. The measuring device includes a platform, a light source and an image capturing device. The platform is used to place the test object with the liquid layer. The light source is used to provide a light beam to illuminate the object to be tested on the platform. The image capturing device is used for detecting the light beam scattered from the object to be tested on the platform. By forming a liquid layer on the surface, the amount of scattering of the light beam impinging on the surface can be increased. Therefore, the image has a high signal-to-noise ratio, and the surface can be accurately measured and the measurement speed is improved.

Description

technical field [0001] The invention relates to a surface measurement system. Background technique [0002] With the advancement of technology, more and more electronic products use transparent materials (such as glass) as product components (such as mobile phone panels, mobile phone casings, lenses). In order to ensure the quality, the surface topography of the transparent component can be measured through measurement. However, the transparent material has a problem of low reflectivity. To obtain a sufficiently accurate image, it is necessary to increase the measurement exposure time and / or light source intensity. If there is a defect inside or at the bottom of the component, it may also be measured, resulting in misjudgment of the signal. In addition, if the surface of the component is a curved surface, multiple reflections will also occur. Contents of the invention [0003] One aspect of the present invention provides a surface measurement system for measuring a test...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/24
Inventor 邱奕昌蔡政廷潘世耀杨兰昇郭修玮锺绍恩
Owner 致茂电子(苏州)有限公司
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