Insulator contamination degree non-contact detection method and device
A detection method and detection device technology, applied in the direction of optical testing flaws/defects, etc., can solve the problems of lack of efficient and simple identification methods, inability to reflect the local contamination degree on the surface of insulators, and time-consuming, and achieve fast and accurate non-contact detection. , The cleaning work is more targeted, and the detection process is simple and efficient.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0031] In order to enable those skilled in the art to better understand the technical solutions in the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the accompanying drawings.
[0032] see figure 1 , the embodiment of the present application provides a non-contact detection method for the degree of contamination of insulators, including:
[0033] In step 101, unsupervised feature learning is performed on the full-band data of the hyperspectral spectral lines in the region of interest of the insulator with different pollution degrees, and the connection weights and feature representations of adjacent levels are obtained.
[0034] Optionally, performing unsupervised feature learning on full-band data of hyperspectral spectral lines in regions of interest of insulators with different pollution degrees, and obtaining connection weights and feature representations of adja...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com