Macro inspection device for glass substrates
A technology for macroscopic inspection and glass substrates, applied in instruments, nonlinear optics, optics, etc., can solve problems such as low work efficiency and waste of resources
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[0041] Specific embodiments of the present disclosure will be described in detail below in conjunction with the accompanying drawings. It should be understood that the specific embodiments described here are only used to illustrate and explain the present disclosure, and are not intended to limit the present disclosure.
[0042] In this disclosure, unless stated to the contrary, the used orientation words such as "upper", "lower", "top", and "bottom" are defined according to the normal use state of the macroscopic inspection device; "inside" , "outside" refers to the contour of the corresponding component itself. In addition, the terms "first", "second", and the like used in the present disclosure are for distinguishing one element from another, and do not have sequence or importance. When the following description refers to the accompanying drawings, the same numerals in different drawings refer to the same or similar elements unless otherwise indicated.
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