Static-state light reflection micro-thermal imaging method and device and terminal equipment
A technology of microscopic thermal imaging and light reflection, which is applied in the directions of measuring devices, optical radiation measurement, radiation pyrometry, etc.
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[0032] In the following description, specific details such as specific system structures and technologies are presented for the purpose of illustration rather than limitation, so as to thoroughly understand the embodiments of the present invention. It will be apparent, however, to one skilled in the art that the invention may be practiced in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present invention with unnecessary detail.
[0033] In order to illustrate the technical solutions of the present invention, specific examples are used below to illustrate.
[0034] The basic feature of photothermal reflection phenomenon is that the reflectivity of the object will change with the temperature of the object. In the prior art, the change of reflectivity with temperature can be considered linear, so it can be characterized by a ...
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