Correcting method for dynamic measured position of photoelectronic width measurer

A dynamic measurement and correction method technology, applied in the field of photoelectric detection, can solve the problems of large jump and tilt, damage to the basic conditions of imaging measurement, measurement errors, etc., and achieve the effect of correcting measurement errors

Inactive Publication Date: 2006-10-18
SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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Problems solved by technology

In order to realize the automatic control of the whole process of strip steel rolling, it is necessary to carry out width detection during the rolling process. At this time, the degree of freedom of strip steel movement increases, which will cause large jumps and inclinations, which destroys the basic conditions of imaging measurement. It causes a large error in the measurement, and the movement characteristics of the strip during the rolling process are as follows: figure 2 shown

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  • Correcting method for dynamic measured position of photoelectronic width measurer
  • Correcting method for dynamic measured position of photoelectronic width measurer
  • Correcting method for dynamic measured position of photoelectronic width measurer

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[0017] The following is based on Figure 3 ~ Figure 5 A preferred embodiment of the present invention is given and described in detail to better illustrate the technical features and functional characteristics of the present invention, but it is not used to limit the scope of the present invention.

[0018] see image 3 , The detection system of the present invention is composed of two groups of CCD cameras, and each group of cameras is composed of an optical system and a linear array CCD device. The strip width measurement adopts the passive imaging measurement method, and the two sets of cameras respectively acquire the images of the strip edge, and obtain the width value through calculation. According to the distance measurement principle of the binocular vision method, two sets of cameras can measure the distance information of the two edges of the strip at the same time, thereby forming a measurement system combining width measurement and distance measurement, and realiz...

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Abstract

The correcting method for dynamic measured position of photoelectronic width measurer is suitable for real-time correction of measurement error caused by the axial runout and inclination of the measured object during linear measurement of photoelectronic width measurer. The method includes extracting axial position information from the width information obtained with the detector so as to make the width measurer possess capacity of recognizing the object position in the optical axis direction and to constitute one integral width measuring and ranging measurement system; calibrating the video camera through experiment; and establishing the target axial runout and inclination correcting relationship with the correcting model, so that the photoelectronic width measurer can correct measurement error timely based on the position information during dynamic measurement.

Description

Technical field: [0001] The invention relates to a photoelectric detection technology, in particular to an online detection technology. Background technique: [0002] The on-line width measurement of strip steel mainly adopts the principle of imaging measurement, and the coaxial ideal optical system can be used to describe the imaging relationship, such as figure 1 As shown in , it is the basic condition for imaging measurement that the measured object maintains the conjugate of the object plane position and the image plane position, and is perpendicular to the optical axis (within the allowable range of error). If the measured object deviates from the object plane (the image plane remains unchanged), the constraint relationship of the conjugate points of the object image is destroyed, and the definition of the image is also affected. When the measured object is not perpendicular to the optical axis OO', the object image Geometric similarity does not reflect the actual prop...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/02
Inventor 童卫旗陈桂林
Owner SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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