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Aging test cabinet

A technology of aging test and cabinet, which is applied in the direction of electronic circuit test, etc., can solve the problems of uneven temperature, inability to cool, high energy consumption of the aging test cabinet, and achieve the effect of convenient aging test and comprehensive and accurate test results

Inactive Publication Date: 2019-06-14
XIAN YIPU COMM TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Because the motherboard to be tested will generate heat when it works in the aging test cabinet, the aging test cabinet is generally equipped with a cooling device. Unable to cool all positions in the aging test cabinet equally, resulting in uneven temperature of each position inside the aging test cabinet, unable to meet the ambient temperature requirements of the aging test

Method used

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Embodiment Construction

[0025] In order to make the object, technical solution and advantages of the present invention clearer, various embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings. However, those of ordinary skill in the art can understand that, in each implementation manner of the present invention, many technical details are provided for readers to better understand the present application. However, even without these technical details and various changes and modifications based on the following implementation modes, the technical solution claimed in this application can also be realized.

[0026] The first embodiment of the present invention relates to a burn-in test cabinet, which is used for performing burn-in tests on the motherboard 1 to be tested. The burn-in test cabinet is used to provide a high-temperature aging environment for the motherboard 1 to be tested. Work at a preset temperature.

[0027] The aging test cabi...

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Abstract

The invention relates to the field of test equipment, in particular to an aging test cabinet. The aging test cabinet comprises a cabinet body and a plurality of laminated plates arranged in the cabinet body, wherein each laminated plate is arranged along the height direction or the width direction of the cabinet body, and the laminated plates are separated from each other to form a plurality of spaces in the cabinet body. The aging test cabinet also comprises a cooling device. Part of the cooling device enters the cabinet body, the part entering the cabinet body is arranged along the arrangement direction of the laminated plates, any laminated plate separates two adjacent spaces, one side of the laminated plate, facing one space, is used for fixing a mainboard to be tested, and the other side of the laminated plate, facing the other space, is used for fixing the part of the cooling device that enters the cabinet body; a plurality of temperature detection modules are distributed in thecabinet body and are used for detecting the temperature in the cabinet body in real time; the main control module is respectively and electrically connected with each temperature detection module andthe cooling device; and the main control module is used for controlling the cooling device in real time according to the temperature values detected by the temperature detection modules.

Description

technical field [0001] The invention relates to the field of test equipment, in particular to an aging test cabinet. Background technique [0002] With the rapid growth of server usage, the accompanying problems also increase, and the burn-in test has become an indispensable device; the burn-in test cabinet is used to provide a high-temperature burn-in environment for the motherboard to be tested, and the motherboard to be tested is always in the burn-in test cabinet. Work at a preset temperature. Because the motherboard to be tested will generate heat when it works in the aging test cabinet, the aging test cabinet is generally equipped with a cooling device. It is impossible to cool all positions in the aging test cabinet equally, resulting in uneven temperature of each position inside the aging test cabinet, which cannot meet the environmental temperature requirements of the aging test. Contents of the invention [0003] The object of the present invention is to provid...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
Inventor 谷新亮折包军刘晨光
Owner XIAN YIPU COMM TECH
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