Unlock instant, AI-driven research and patent intelligence for your innovation.

SYSTEM INFORMATION inspection method and device under SMBIOS

An inspection method and a technology for an inspection device are applied in the directions of faulty hardware testing methods, error detection/correction, detection of faulty computer hardware, etc., which can solve problems such as time-consuming and energy-consuming, and achieve the effect of simple testing methods.

Inactive Publication Date: 2019-07-05
INSPUR SUZHOU INTELLIGENT TECH CO LTD
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The inspection of system information under SMBIOS of traditional servers is basically done manually. It is necessary to search the "Handle xxxx, DMI type 3, xxxx" field in smbios.txt to compare with the actual FRU information. If multiple servers are tested at one time, It will be an extremely time-consuming and labor-intensive project.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • SYSTEM INFORMATION inspection method and device under SMBIOS
  • SYSTEM INFORMATION inspection method and device under SMBIOS

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0019] In order to make the purpose, technical solution and advantages of the present invention more clear, the embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings. It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined arbitrarily with each other.

[0020] Such as figure 1 Shown, the SYSTEM INFORMATION inspection method under a kind of SMBIOS of the present invention comprises the following steps:

[0021] Log in to the OS system, and modify the System Information information through the ipmitool fru edit command; when the product just leaves the factory, there is no information data, and the obtained value is null, and the System Information information is filled and modified through the ipmitool fru edit command.

[0022] Restart the OS:

[0023] Restart the system through the reboot command, wait for 5 minutes, and ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an SYSTEM INFORMATION inspection method under an SMBIOS, and the method comprises the following steps of logging in an OS system, and modifying the System Information throughan ipmitool fru edit instruction; restarting the OS; and obtaining the System Information of the to-be-tested machine system, and comparing the System Information with the System Information obtainedin the first step. According to the present invention, a plurality of servers can be tested at the same time, scripts are placed on the platform and executed in batches, and the testing efficiency isgreatly improved; logs are used as records in the whole process, which server has inconsistent system information is subsequently confirmed, the problem can be quickly positioned, the test process issimple and clear, and multiple items can be reused.

Description

technical field [0001] The invention relates to a method and device for checking System Information under SMBIOS. Background technique [0002] SMBIOS is a unified specification for motherboard or system manufacturers to display product management information in a standard format. It is an open technical standard drafted by the industry guidance organization Desktop Management Task Force (DMTF). Therefore, the System Information information under SMBIOS Inspection is very important. The inspection of system information under SMBIOS of traditional servers is basically done manually. It is necessary to search the "Handle xxxx, DMI type 3, xxxx" field in smbios.txt to compare with the actual FRU information. If multiple servers are tested at one time, It will be a huge project that consumes a lot of time and energy. Contents of the invention [0003] The technical problem to be solved by the present invention is to propose a SYSTEM INFORMATION inspection method and device u...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/00G06F11/22
CPCG06F11/006G06F11/2273
Inventor 马晴
Owner INSPUR SUZHOU INTELLIGENT TECH CO LTD