Storage device testing method, system and device and computer readable storage medium

Abstract

The invention discloses a storage device testing method. The method comprises: logging in a target storage device according to a received testing command; selecting a target test case in the target storage device according to the test command; executing the target test case by using the parameter information of the target test case to obtain a test result. According to the storage device testing method, automatic testing of all the performance of the storage device can be achieved, the testing workload is greatly reduced, the labor cost and the time cost are saved, the testing efficiency is effectively improved, and meanwhile the bug occurrence rate is reduced to a great extent due to the fact that automatic testing is achieved. The invention further discloses a storage device testing system and device and a computer readable storage medium which all have the above beneficial effects.

Description

technical field [0001] The present application relates to the technical field of storage systems, in particular to a storage device testing method, and also to a storage device testing system, device, and computer-readable storage medium. Background technique [0002] In the development process of storage products, due to the characteristics of high code complexity, difficult departmental collaboration, and high coupling between different products, every slight change to the code may affect the functions that have been tested or affect other products. The functions of the modules, therefore, need to be effectively tested by the R&D staff before the product is transferred to the testing department. [0003] However, in the testing process of the existing technology, professional technicians have to manually run the test cases of the storage device every time, the workload is heavy, the time cost is too high, and the test efficiency is reduced; Manual operations are performed...

AI Technical Summary

Problems solved by technology

[0003] However, in the testing process of the existing technology, professional technicians have to manually run the test cases of the storage device every time, the workload is heavy, the time cost is too high, and the test efficiency is reduced; Manual operations are performed by personnel, and the occurrence rate of bugs during the test process is high, so it is necessary to continuously make mistakes and correct them, which increases labor costs and further reduces test efficiency

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