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Vibration inspection instrument and its low-power frequency domain transformation method, and computer-readable storage medium

A frequency domain transformation and inspection instrument technology, applied in the field of signal detection, can solve problems such as difficulty and high current consumption, and achieve the effect of short time

Active Publication Date: 2021-07-20
上海岚盒信息技术有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0002] At present, the total power consumption of the system is considered from the design of the vibration inspection instrument. In order to reduce power consumption, the MCU with lower power consumption is generally selected from the chip selection, but it is difficult for the MCU to realize the Fourier transform of the vibration signal; and the support is completed. High-performance chips for Fourier transform of vibration signals need to consume high current, which is a challenge for low-power vibration detectors

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  • Vibration inspection instrument and its low-power frequency domain transformation method, and computer-readable storage medium
  • Vibration inspection instrument and its low-power frequency domain transformation method, and computer-readable storage medium
  • Vibration inspection instrument and its low-power frequency domain transformation method, and computer-readable storage medium

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Embodiment Construction

[0031] Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. Although exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be limited by the embodiments set forth herein. Rather, these embodiments are provided for more thorough understanding of the present disclosure and to fully convey the scope of the present disclosure to those skilled in the art.

[0032] figure 1 A schematic circuit connection diagram of a vibration inspection instrument according to an embodiment of the present invention is shown. Such as figure 1 As shown, the vibration inspection instrument of the embodiment of the present invention is provided with a main control module 1, an auxiliary module 2, a communication module 3, a memory 4, a reset switch 5, a power switch 6, a temperature sensor 7, an LED, a v...

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Abstract

The invention relates to a vibration inspection instrument, a low-power frequency domain conversion method thereof, and a computer-readable storage medium. The vibration inspection instrument includes an acquisition module, which is used to collect peripheral signals of the vibration inspection instrument; a low-power main control module, which records the signals; and a high-performance auxiliary module that is normally turned off, which periodically is enabled to perform a frequency domain transform on said signal recorded during said period. Since the time-consuming collection tasks are handled by the low-power main control module, the auxiliary modules with higher energy consumption are only occasionally started to perform frequency domain conversion, and the frequency domain conversion time is short, so the auxiliary modules with higher energy consumption will not consume too much energy , making the vibration inspection instrument realize low power consumption operation.

Description

technical field [0001] The invention relates to the technical field of signal detection, in particular to a vibration inspection instrument, a low-power frequency domain transformation method thereof, and a computer-readable storage medium. Background technique [0002] At present, the total power consumption of the system is considered in the design of the vibration inspection instrument. In order to reduce power consumption, the MCU with lower power consumption is generally selected from the chip selection, but it is difficult for the MCU to realize the Fourier transform of the vibration signal; and the support is completed High-performance chips for Fourier transform of vibration signals need to consume high current, which is a challenge for low-power vibration detectors. Contents of the invention [0003] In view of the above problems, the present invention is proposed to provide a vibration inspection instrument, a low power consumption measurement method thereof, and...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01D21/02
CPCG01D21/02
Inventor 沈宇峰陈美吴可平邹睿
Owner 上海岚盒信息技术有限公司