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Edge node testing method, electronic equipment, system and medium

A technology of edge nodes and electronic equipment, applied in the field of testing, can solve the problems of low test accuracy and normal operation impact, and achieve the effect of taking into account the accuracy and reducing the impact

Pending Publication Date: 2019-08-02
SHENZHEN ONETHING TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The main purpose of the present invention is to provide an edge node testing method, electronic equipment, system and medium, aiming to solve the problem that the normal operation of each service on the node is affected and the test accuracy is low when the edge node test is performed

Method used

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  • Edge node testing method, electronic equipment, system and medium
  • Edge node testing method, electronic equipment, system and medium

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Embodiment Construction

[0062] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0063] The terms "first", "second", "third", "fourth", etc. (if any) in the specification and claims of the present application and the above drawings are used to distinguish similar objects, and not necessarily Used to describe a specific sequence or sequence. It is to be understood that the terms so used are interchangeable under appropriate circumstances such that the embodiments describ...

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Abstract

The invention discloses an edge node test method, electronic equipment, a system and a medium. The method comprises the following steps: acquiring test data of an edge node; determining a starting test time period from the test data; acquiring current time; when the current time is in the starting test time period, detecting a state parameter of the electronic equipment; and testing the edge nodesaccording to the state parameters. According to the invention, when the edge node test is carried out, the influence on the normal operation of each service on the node is reduced by combining the state parameters, and meanwhile, the test accuracy can be considered.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to an edge node testing method, electronic equipment, a system and a medium. Background technique [0002] In distributed computing, the storage performance of edge nodes has a great influence on the availability of nodes. Therefore, when measuring the performance of nodes, it is necessary to test the performance of storage resources of nodes. [0003] The number of edge nodes in distributed cloud computing is very large, and the operating status and environment of the nodes are complex. When using the traditional multiple-test averaging strategy, the node storage performance measured in different operating states varies greatly. Therefore, it is impossible to quickly obtain More accurate storage performance data will seriously affect the availability evaluation of edge nodes. Contents of the invention [0004] The main purpose of the present invention is to provide an edge node ...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/30G06F11/34G06F9/445
CPCG06F11/3034G06F11/3409G06F11/3433G06F11/3055G06F9/44505
Inventor 尹欣
Owner SHENZHEN ONETHING TECH CO LTD