Detection method of high-voltage switch insulation material sintering microscopic defect and application thereof

Abstract

The invention relates to a detection method of a high-voltage switch insulation material sintering microscopic defect and an application thereof. The detection method of the high-voltage switch insulation material sintering microscopic defect comprises the following steps: 1) performing a freezing treatment on a high-voltage switch insulation material test piece at a temperature not higher than -70 degrees centigrade; 2) performing a fracture treatment on the high-voltage switch insulation material test piece at the freezing treatment temperature to prepare an analysis sample piece including asection; and 3) performing a metal spraying treatment on the analysis sample piece, and then performing scanning electron microscope analysis on the section to detect the microscopic defects of the section. The detection method of the high-voltage switch insulation material sintering microscopic defect utilizes the fracture of the insulation material under a low temperature freezing condition toretain the original tissue state, and then uses the scanning electron microscope to observe the microstructure of the section, and finally determines the internal microscopic defects of the insulationmaterial. The detection method of the high-voltage switch insulation material sintering microscopic defect has high detection sensitivity for microscopic defects with small internal dimensions of theinsulation material, and the relevant detection results can be used for making an estimation and evaluation of the sintering process and the voltage-resistant performance of the product.

Description

technical field [0001] The invention belongs to the field of detection of sintered structure defects, in particular to a detection method and application of sintered microscopic defects of high-voltage switch insulating materials. Background technique [0002] Insulation technology is one of the core technologies in the field of high-voltage switches. High-voltage switch insulation materials (such as epoxy resin insulators, PTFE nozzles, etc.) are generally based on PTFE powder and epoxy resin powder and add a certain amount of Modified materials are made of mixed materials and sintered at high temperature. The quality of their molding properties directly affects the withstand voltage performance of the product. Once there are too many internal defects, the withstand voltage performance will decrease, and even lead to insulation breakdown. Therefore, the detection of its internal microscopic defects has become a crucial task in the insulation technology of high-voltage switc...

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to provide a method for detecting microscopic defects of sintered insulating materials of high-voltage switches, so as to solve the problem that the existing methods cannot detect the microscopic defects of the internal structure

[0006] The second o

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