Test method and test circuit of io bridge short circuit
A technology for testing circuits and testing signals, which is applied in the field of integrated circuits and can solve the problems of increased test costs, limited number of detection pins, and increased number of input/output channels.
Active Publication Date: 2021-08-06
SHANGHAI ANLOGIC INFOTECH CO LTD
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[0003] In the prior art, automatic test equipment (Automatic Test Equipment, ATE) is usually used to detect bridging faults between the pins of integrated circuits, but the automatic test equipment is expensive, which increases the test cost, and the input / output of the automatic test equipment The number of (Input / Output, IO) channels is limited, and the number of additional input / output channels cannot be added freely, so that the number of detection pins is limited and cannot meet the detection needs of a large number of pins
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[0042] In order to make the purpose, technical solutions and advantages of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings of the present invention. Obviously, the described embodiments are part of the present invention Examples, not all examples. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention. Unless otherwise defined, the technical terms or scientific terms used herein shall have the usual meanings understood by those skilled in the art to which the present invention belongs. As used herein, "comprising" and similar words mean that the elements or items appearing before the word include the elements or items listed after the word and their equivalents, without excluding other el...
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The invention provides a test method for IO bridge short circuit, which comprises receiving a test signal, entering a test mode, setting the access modes of m pins as input mode, setting the first pin as output mode, collecting the first pin The first response signal of the pin, collect the second response signal of the remaining m-1 said pins, and output it as a test result, and then restore the first pin to the input mode until the completion of the m said tubes Foot detection. In the test method of the IO bridge short circuit, a test signal path is provided, and the test mode is entered by receiving the test signal, which avoids the use of high-cost automated test equipment and reduces the detection cost; the m pins are set to Output mode, and then restore to input mode after detection, so that the detection can not be limited by the number of pins. The present invention also provides a test circuit for realizing the test method of the IO bridge short circuit.
Description
technical field [0001] The invention relates to the technical field of integrated circuits, in particular to an IO bridge short-circuit test method and a test circuit. Background technique [0002] Pins are often used in integrated circuits, and bridging fault detection is often required between pins used in integrated circuits. [0003] In the prior art, automatic test equipment (Automatic Test Equipment, ATE) is usually used to detect bridging faults between the pins of integrated circuits, but the automatic test equipment is expensive, which increases the test cost, and the input / output of the automatic test equipment The number of (Input / Output, IO) channels is limited, and the number of additional input / output channels cannot be added freely, so that the number of detection pins is limited, and the detection requirements of a large number of pins cannot be met. [0004] Therefore, it is necessary to provide a novel IO bridge short-circuit test method and test circuit t...
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IPC IPC(8): G01R31/28G01R31/52
CPCG01R31/2853G01R31/50
Inventor 郑莉徐春华袁智皓赵永胜
Owner SHANGHAI ANLOGIC INFOTECH CO LTD