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Chip working environment temperature detection method and system and readable storage medium

A technology of ambient temperature and working environment, applied in the directions of thermometers, thermometer applications, error detection/correction, etc. question

Inactive Publication Date: 2019-08-16
ZHENGZHOU XINDA JIEAN INFORMATION TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the above method needs to be equipped with a special temperature detection device, which increases the detection cost of the working environment temperature. At the same time, the temperature detection device will occupy the working space of the electrical equipment, which is not conducive to the miniaturization and compact design of the electrical equipment.

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  • Chip working environment temperature detection method and system and readable storage medium
  • Chip working environment temperature detection method and system and readable storage medium
  • Chip working environment temperature detection method and system and readable storage medium

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Embodiment Construction

[0047] In order to understand the above-mentioned purpose, features and advantages of the present invention more clearly, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be noted that, in the case of no conflict, the embodiments of the present application and the features in the embodiments can be combined with each other.

[0048] In the following description, many specific details are set forth in order to fully understand the present invention. However, the present invention can also be implemented in other ways different from those described here. Therefore, the protection scope of the present invention is not limited by the specific details disclosed below. EXAMPLE LIMITATIONS.

[0049] figure 1 A flow chart showing a method for detecting the working environment temperature of a chip of the present invention is shown.

[0050] Such as figure 1 As shown, the first aspect of...

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Abstract

The invention provides a chip working environment temperature detection method and system and a readable storage medium. The method comprises the steps of setting a CPU load test value and an environment temperature test value of a chip; measuring a corresponding chip temperature test value under the conditions of the CPU load test value and the environment temperature test value; repeating the two steps for many times to obtain a plurality of groups of CPU load test values, environment temperature test values and chip temperature test values; based on the plurality of groups of CPU load testvalues, ambient temperature test values and chip temperature test values, analyzing an algorithm for deducing the ambient temperature test values according to the chip temperature test values and theCPU load test values; and when the chip is in a working state, according to the CPU load value and the chip temperature value in the current state and based on the algorithm, predicting a corresponding environment temperature value. According to the invention, the working environment temperature can be effectively monitored under the condition that no hardware is added, and necessary protection means can be effectively provided for the abnormal environment temperature.

Description

technical field [0001] The invention relates to the technical field of temperature detection, in particular to a method, a system and a readable storage medium for detecting the temperature of a working environment of a chip. Background technique [0002] At present, some electrical equipment (such as Xilinx platform chips) have strict requirements on the working environment temperature. If the working environment temperature is too high, it may cause the electrical equipment to shut down or crash, and the normal operation of the electrical equipment cannot be guaranteed. [0003] Traditionally, in order to ensure the normal operation of electrical equipment, electrical equipment is usually equipped with an ambient temperature detection device, and the ambient temperature detection device is used to detect the working environment temperature of the electrical equipment. When some abnormal working environment temperature is detected , the electrical equipment can automaticall...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/30G01K13/00
CPCG06F11/3024G06F11/3058G01K13/00
Inventor 孙晓鹏马骥焦小涛王鹏王斌王凯霖卫志刚李亚运
Owner ZHENGZHOU XINDA JIEAN INFORMATION TECH
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