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Chip age judgment method and device, chip and terminal

A technology for judging devices and chips, which is applied in the direction of instruments, error detection/correction, calculation, etc., and can solve the problems of inability to accurately determine the age of chips, failure to achieve the effect of acceptance, time-consuming and labor-intensive problems, etc.

Active Publication Date: 2019-08-20
OPEN SECURITY RES INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This judgment method is time-consuming and laborious, and due to the change of refurbishment technology, it often cannot achieve the effect of acceptance, and at the same time cannot accurately judge the age of the chip

Method used

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  • Chip age judgment method and device, chip and terminal
  • Chip age judgment method and device, chip and terminal
  • Chip age judgment method and device, chip and terminal

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Embodiment Construction

[0020] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0021] The chip described in the embodiment of the present invention is a digital chip with a static random access memory (SRAM). The function of the chip itself is not limited.

[0022] The following will further explain and illustrate with specific embodiments in conjunction with the accompanying drawings, and the embodiments do not consti...

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PUM

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Abstract

The embodiment of the invention relates to a chip age judgment method and device, a chip and a terminal. The chip age judgment method comprises the steps: controlling a chip SRAM to be powered on andpowered off for multiple times; obtaining powered-on feedback values of the SRAM for multiple times; calculating the error rate of the powered-on feedback value of the SRAM obtained for multiple times; and judging the age of the chip according to the error rate. By implementing the embodiment of the invention, the age of the chip can be accurately judged.

Description

technical field [0001] The invention relates to the field of chip detection, in particular to a chip age judging method, device, chip and terminal. Background technique [0002] Because of the relationship between the global chip supply chain, governments, companies and other units purchase chips from various sources. Recycling and refurbishing chips and selling them to relevant units is already a common means of profiting from black production. Related to the government, the company's use of refurbished chip products will have a huge impact on its own product stability. The current method only judges whether the internal structure is aging by judging the appearance of the chip or by physically invading the chip. This judgment method is time-consuming and laborious, and due to the change of refurbishment technology, it often cannot achieve the effect of acceptance, and at the same time cannot accurately judge the age of the chip. How to accurately judge the chip age is a ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/00G06F11/30G06F11/34
CPCG06F11/008G06F11/3037G06F11/3419Y02D10/00
Inventor 周煜梁
Owner OPEN SECURITY RES INC