Method, apparatus and device for acquiring process model
A process model and model error technology, which is applied to controllers, electric controllers, instruments, etc. with specific characteristics, can solve problems such as large errors in process models, and achieve the effect of solving large errors and excellent data processing characteristics.
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[0045] The above is the first embodiment of a method for obtaining a process model provided by the embodiment of the present application, and the following is the second embodiment of the method for obtaining a process model provided by the embodiment of the present application.
[0046] see figure 2 , a schematic flowchart of a second embodiment of a method for obtaining a process model in the embodiment of the present application, including:
[0047] Step 201. Obtain the process response trend curve of the process object when a unit step is input.
[0048] In this embodiment, the process response trend curve of the process object when the unit step input is obtained is as follows: image 3 shown.
[0049] Step 202, obtaining the position point on the process response trend curve with the largest tangent slope.
[0050] In this embodiment, the position point with the largest tangent slope on the process response curve is obtained, such as image 3 Shown at point P in . ...
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