Device and method for obtaining crystal microtexture orientation

Abstract

Aiming at the technical shortcomings of the traditional microtexture testing technique (SEM-EBSD) that cannot measure the microtexture of samples with large plastic deformation or nano-grain scale samples, the present invention provides a crystal microtexture orientation method based on transmission electron microscopy (TEM). An acquisition device and an acquisition method, the acquisition device is composed of a sample cutting device, a sample clamping device, an image acquisition device, an angle acquisition device and a computer; the acquisition method can finally calculate the Euler angle ( φ 1 ,Ф,φ 2 ). Beneficial technical effects: the invention can obtain the microscopic texture of the measurement area, and can target any large plastic deformation sample and nanoscale sample, and can overcome the limited spatial resolution of the traditional scanning electron microscope backscattering diffraction technology and the low calibration rate of large strain samples The problem.

Description

Acquisition device and acquisition method of crystal microtexture orientation technical field The invention belongs to the field of material microtexture measurement, in particular to a kind of equipment and The test method is specifically an acquisition device and acquisition method of crystal microtexture orientation. Background technique Texture refers to the preferential distribution state of crystal orientation in polycrystalline materials, and its existence will have a negative impact on the performance of materials. very important impact. The determination of texture is usually done on an X-ray diffractometer equipped with special inspection accessories, and the test results reflect the It reflects the macroscopic distribution characteristics of grain orientation in the sample, so it is also called macroscopic texture. Backscattered electrons diffracted by SEM With the advent of SEM‑EBSD technology, the concept of microtexture was introduced. Key results fr...

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Problems solved by technology

[0005] The purpose of the present invention is to recombine and utilize the existing equipment for metal bulk samples with large plastic deformation, obtain parameters and substitute them into the newly proposed function formula, so as to obtain the micro texture orientation test method and solve the problem of SEM-EBSD technology The problem of limited spatial resolution and inability to apply to large plastic deformation samples provides an effective and feasible way for the combination of microscopic texture analysis methods and TEM traditional contrast analysis methods

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