Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Crystal micro-texture orientation obtaining device and obtaining method

An acquisition device and acquisition method technology, applied in measurement devices, instruments, scientific instruments, etc., can solve the problems of limited spatial resolution and inability to apply large plastic deformation samples, etc.

Active Publication Date: 2019-10-22
HEFEI UNIV OF TECH
View PDF8 Cites 8 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to recombine and utilize the existing equipment for metal bulk samples with large plastic deformation, obtain parameters and substitute them into the newly proposed function formula, so as to obtain the micro texture orientation test method and solve the problem of SEM-EBSD technology The problem of limited spatial resolution and inability to apply to large plastic deformation samples provides an effective and feasible way for the combination of microscopic texture analysis methods and TEM traditional contrast analysis methods
in:

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Crystal micro-texture orientation obtaining device and obtaining method
  • Crystal micro-texture orientation obtaining device and obtaining method
  • Crystal micro-texture orientation obtaining device and obtaining method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0133] Determination of Micro Texture Orientation of AZ31B Magnesium Alloy Rolled Sheets:

[0134] (1) Cut the sample into 0.5mm thin slices along the rolling direction (RD) and normal direction (ND) of the magnesium alloy rolling plate, such as image 3 shown. Use 200#, 400#, 600# and 800# metallographic sandpaper to grind the thin slice sample to 0.1mm in turn, cut the thin slice sample into a Φ3mm disc with a TEM sample punch, and mark the rolling direction RD of the rolled plate on the disc And the ND direction of the normal line of the rolling plate, using the HNO3-CH3OH electrolyte, the TEM observation sample was prepared by the electrolytic double spray method.

[0135] (2) Place the wafer sample on the TEM bidirectional tilting sample stage, and put it into the transmission electron microscope for observation. Note that when placing the sample, make sure that the RD direction marked on the disc sample is consistent with the X-axis direction of the shaft horizontal di...

Embodiment 2

[0151] Determination of micro-texture orientation for industrial pure aluminum extruded rods:

[0152] (1) Cut the sample along the cross-section of the extruded rod perpendicular to the extrusion direction (ED) (eg Figure 5 Shown), cut into 0.5mm thin slices, grind the thin slice samples to 0.1mm with 200#, 400#, 600# and 800# metallographic sandpaper in turn, cut the thin slice samples into Φ3mm discs with TEM sample punch, and The extrusion direction (TD1) and transverse direction (TD2) of the bar are marked on the wafer, and the HNO3-CH3OH electrolyte is used to prepare the TEM observation sample by the electrolytic double-spray method.

[0153] (2) Place the wafer sample on the TEM bidirectional tilting sample stage, and put it into the transmission electron microscope for observation. Note that when placing the sample, make sure that the TD2 direction marked in the disc sample is consistent with the X-axis direction of the shaft horizontal direction of the TEM bidirect...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
diameteraaaaaaaaaa
thicknessaaaaaaaaaa
Login to View More

Abstract

The invention provides a crystal micro-texture orientation obtaining device and obtaining method based on a transmission electron microscope (TEM), and aims at the technical shortcomings that the traditional micro-texture test technique (SEM-EBSD) is unable to measure the micro-texture of a large plastic deformation sample or a nanocrystal-scale sample. The obtaining device is composed of sample cutting equipment, sample clamping equipment, image acquisition equipment, angle acquisition equipment and a computer. The obtaining method can finally calculate the micro-texture Euler angle (phi1, phi, phi2) of the measured region. The beneficial technical effects are that the invention the micro-texture of the measured region can be obtained and the problems of limited spatial resolution of thetraditional scanning electron microscope backscattering diffraction technique and low calibration rate of the large strain amount sample of any large plastic deformation sample and nano-scale sample can be overcome.

Description

technical field [0001] The invention belongs to the field of material microtexture measurement, and in particular relates to a device and a test method for crystal microtexture orientation, specifically an acquisition device and method for crystal microtexture orientation. Background technique [0002] Texture refers to the preferred distribution state of crystal orientation in polycrystalline materials, and its existence will have a very important impact on the properties of materials. The measurement of texture is usually done on an X-ray diffractometer equipped with special detection accessories. The test results reflect the macroscopic distribution characteristics of grain orientation in the sample, so it is also called macroscopic texture. With the emergence of scanning electron microscope backscattered electron diffraction (SEM-EBSD) technology, the concept of micro texture is introduced. The main result obtained by the SEM-EBSD technology test is the phase and orient...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/20058G01N23/20008
CPCG01N23/20058G01N23/20008
Inventor 张真郭朋彭金华黄继安陈畅王珊吴玉程
Owner HEFEI UNIV OF TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com