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LCD device pin electrical index fast test method

A test method and technology for the electrical properties of the pins are applied in the field of rapid testing of the electrical properties of LCD device pins, which can solve the problems of poor electrical properties of the pins, inability to test, and side effects, so as to improve reliability and accuracy and meet application requirements. Demand, the effect of avoiding missed inspections

Active Publication Date: 2019-10-22
SHENZHEN QUANZHOU AUTOMATION EQUIP TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, there are also side effects after the pins are connected in parallel. If there is electrical failure between the paralleled pins, it will not be possible to test

Method used

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  • LCD device pin electrical index fast test method
  • LCD device pin electrical index fast test method
  • LCD device pin electrical index fast test method

Examples

Experimental program
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Embodiment 1

[0029] See image 3 , to test the insulation resistance between 16 COM pins as an example, first take 1(=2 0 ) The root pin is the interval to divide all the COM pins into adjacent A 0 , B 0 Two groups, test whether the insulation resistance between the two groups is qualified. Then, with 2(=2 1 ) The root pin is the span to divide all COM pins into A 1 , B 1 Two groups were tested. Then, with 4(=2 2 ) The root pin is the span to divide all COM pins into A 2 , B 2 Two groups were tested. Finally, with 8(=2 3 ) The root pin is the span to divide all COM pins into A 3 , B 3 Two groups were tested. This covers 2 with only 4 tests 4 = 16 pins, and any two pins have been divided into different groups during the test process, when the insulation resistance between any two COM pins is defective, it can be detected at least once, It not only improves the efficiency of scanning test, but also effectively avoids the occurrence of missed detection, thereby improving the re...

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PUM

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Abstract

The invention discloses an LCD device pin electrical index fast test method, which comprises the following steps: S1) dividing the same type of pins in an LCD device into multiple An groups and multiple Bn groups, wherein the An groups and the Bn groups are alternate, and the number of pins in the An groups and the number of pins in the Bn groups are 2m; S2) carrying out test initialization, and letting n=0 and m=0; S3) testing whether the electrical indexes of the An groups and the Bn groups are qualified, if not, reminding unqualified, and if so, performing the step S4); S4) letting n=n+1, m=m+1; S5)connecting all of the pins in the An groups in parallel and connecting all of the pins in the Bn groups in parallel, testing whether the electrical indexes of the An groups and the Bn groupsare qualified, if not, reminding unqualified, and if so, performing the step S6); S6) judging whether the number of the An groups and the number of the Bn groups are 1, if not , performing the step S4), and if so, performing the step S7); and S7) ending the test. The method can improve scanning test efficiency and avoid inspection missing.

Description

technical field [0001] The invention relates to a method for testing an LCD device, in particular to a method for quickly testing the electrical index of an LCD device pin. Background technique [0002] LCD products usually have multiple pins, and defects such as short circuit or excessive scanning current may occur between any pins. The traditional testing method is to traverse all the pins and only test the electrical parameters of one pin at a time. Specifically, see figure 1 , assuming that there are M COM pins and N SEG pins in an LCD product, then when testing the insulation resistance of all pins, it is necessary to traverse all M COM pins and test each COM pin (between other COM pins) Then traverse the N SEG pins and test the resistance of each SEG pin (between other SEG pins) respectively. When testing the scan current of each pin, the method is similar. The efficiency of the above test method is low, and M+N tests need to be performed for each electrical inde...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R27/02G01R31/00
CPCG01R27/02G01R31/00
Inventor 黄双平华卫华朱庆华
Owner SHENZHEN QUANZHOU AUTOMATION EQUIP TECH CO LTD