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A quick test method for electrical index of pins of lcd device

A testing method and pin electrical technology, which is applied in the field of rapid testing of LCD device pin electrical indicators, can solve problems such as untestability, side effects, and poor pin electrical properties, so as to improve reliability and accuracy and meet application requirements. Requirements, the effect of avoiding missed detection

Active Publication Date: 2021-05-25
SHENZHEN QUANZHOU AUTOMATION EQUIP TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, there are also side effects after the pins are connected in parallel. If there is electrical failure between the paralleled pins, it will not be possible to test

Method used

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  • A quick test method for electrical index of pins of lcd device
  • A quick test method for electrical index of pins of lcd device
  • A quick test method for electrical index of pins of lcd device

Examples

Experimental program
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Embodiment 1

[0029] See image 3 , to test the insulation resistance between 16 COM pins as an example, first take 1(=2 0 ) The root pin is the interval to divide all the COM pins into adjacent A 0 , B 0 Two groups, test whether the insulation resistance between the two groups is qualified. Then, with 2(=2 1 ) The root pin is the span to divide all COM pins into A 1 , B 1 Two groups were tested. Then, with 4(=2 2 ) The root pin is the span to divide all COM pins into A 2 , B 2 Two groups were tested. Finally, with 8(=2 3 ) The root pin is the span to divide all COM pins into A 3 , B 3 Two groups were tested. This covers 2 with only 4 tests 4 = 16 pins, and any two pins have been divided into different groups during the test process, when the insulation resistance between any two COM pins is defective, it can be detected at least once, It not only improves the efficiency of scanning test, but also effectively avoids the occurrence of missed detection, thereby improving the re...

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PUM

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Abstract

The invention discloses a method for quickly testing the electrical index of LCD device pins, which includes the following steps: step S1, dividing the same type of pins in the LCD device into multiple A n group and multiple b n Group, A n Group and B n Group staggered separation, A n Group pin count and B n The number of pins in the group is 2 m ; step S2, test initialization, let n=0, m=0; step S3, test A n Group and B n Whether the electrical index of the group is qualified, if not, then prompt unqualified, if so, then execute step S4, step S4, make n=n+1, m=m+1; Step S5, each A n All pins in the group are connected in parallel with each other, connecting each B n All pins in the group are connected in parallel with each other, test A n Group and B n Whether the electrical index of the group is qualified, if not, then prompt unqualified, if so, then perform step S6; step S6, judge A n number of groups and B n Whether the number of groups is 1, if not, execute step S4, if yes, execute step S7; step S7, the test ends. The invention can improve the scanning test efficiency and avoid missed detection.

Description

technical field [0001] The invention relates to a method for testing an LCD device, in particular to a method for quickly testing the electrical index of an LCD device pin. Background technique [0002] LCD products usually have multiple pins, and defects such as short circuit or excessive scanning current may occur between any pins. The traditional testing method is to traverse all the pins and only test the electrical parameters of one pin at a time. Specifically, see figure 1 , assuming that there are M COM pins and N SEG pins in an LCD product, then when testing the insulation resistance of all pins, it is necessary to traverse all M COM pins and test each COM pin (between other COM pins) Then traverse the N SEG pins and test the resistance of each SEG pin (between other SEG pins) respectively. When testing the scan current of each pin, the method is similar. The efficiency of the above test method is low, and M+N tests need to be performed for each electrical index....

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R27/02G01R31/00
CPCG01R27/02G01R31/00
Inventor 黄双平华卫华朱庆华
Owner SHENZHEN QUANZHOU AUTOMATION EQUIP TECH CO LTD