Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Wheat scab monitoring method based on satellite remote sensing

A wheat scab and satellite remote sensing technology, applied in the direction of color/spectral characteristic measurement, data processing applications, instruments, etc., can solve the problems of wheat scab index characteristics, differences in non-disease factors, lack of consideration, etc., and achieve reduction Large-area monitoring efficiency and the effect of reducing the amount of sample experiments

Pending Publication Date: 2019-10-22
中科光启空间信息技术有限公司
View PDF0 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, due to the obvious differences in the index characteristics and non-disease factors affecting wheat scab at different regional scales, in addition, the meteorological factors that have a greater impact on scab also mainly consider the relevant indicators reflecting the near-surface atmosphere rather than the surface temperature, especially It is due to the lack of consideration of the precipitation that has a greater impact on scab, so the previous models still have some shortcomings in the monitoring of large areas and the description of agricultural meteorological conditions.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Wheat scab monitoring method based on satellite remote sensing
  • Wheat scab monitoring method based on satellite remote sensing
  • Wheat scab monitoring method based on satellite remote sensing

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0094] This embodiment is used to illustrate the present invention.

[0095] Step 1: Get the remote sensing data and meteorological precipitation data of the wheat planting area in the predicted year and N years before the predicted year,

[0096] The remote sensing data includes multispectral data and thermal infrared remote sensing data;

[0097] In this example, the detection area is winter wheat planting in Henan Province, which has a large range. In order to reduce the amount of data and the data processing time during the period, the remote sensing data uses MODIS 09Q1 data with a resolution of 250m and the time is the middle and early April of 2009-2019. The data uses MODIS 11A2 data with a resolution of 1000*1000m from late March to mid-to-early April. The meteorological precipitation data time is the daily average precipitation data from late March to mid-to-early April collected by meteorological stations across the province, and the rest of the data are from Henan ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a wheat scab monitoring method based on satellite remote sensing, and belongs to the technical field of remote sensing monitoring, and the method comprises the steps: firstly obtaining the remote sensing data and meteorological rainfall data of a wheat planting region in a predicted year and N years before the predicted year, wherein the remote sensing data comprise multispectral data and thermal infrared remote sensing data; calculating a relative growth vigor index by utilizing the multispectral data; obtaining a normalized surface temperature index by using the multispectral data and the thermal infrared remote sensing data; obtaining a normalized precipitation index by using the meteorological precipitation data; and finally, calculating the wheat scab incidenceindex of the predicted year by utilizing the relative growth vigor index, the normalized earth surface temperature index and the normalized rainfall index. According to the method, the interference of the difference of wheat growth vigor in different areas in large-scale monitoring on the gibberellic disease monitoring model can be well reduced, and the objectivity and practicability of gibberellic disease remote sensing monitoring are improved.

Description

technical field [0001] The invention relates to the technical field of remote sensing monitoring, in particular to a method for monitoring wheat scab based on satellite remote sensing. Background technique [0002] At present, most of the researches on the monitoring of wheat head blight using remote sensing technology are based on the changes reflected in the spectral characteristics of wheat leaves when the disease occurs. Sensitive indicators of scab occurrence to establish relevant estimation models; because the analysis process of sensitive indicators often requires a large amount of leaf spectral analysis data as the basis, and the growth status of wheat in different regional environments and the agro-ecological conditions and diseases that affect wheat growth There are also differences in non-disease factors. Therefore, some remote sensing monitoring models of wheat scab often have problems such as large-scale sample collection and laboratory workload, low timeliness,...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06Q50/02G01N21/25
CPCG06Q50/02G01N21/25
Inventor 聂岩刘辉张莉常利
Owner 中科光启空间信息技术有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products