Full-waveband window-free wavelength standard light source and wavelength calibration method

A full-band and wavelength technology, which is applied in the field of full-band windowless wavelength standard light source and wavelength calibration, can solve the problems of wavelength dependence, change, processing accuracy, etc., and achieve the effect of uniform and uniform distribution of spectral lines

Pending Publication Date: 2019-11-05
XIAMEN UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the wavelength of these spectral lines depends on the cavity length of the etalon, is affected by processing accuracy, and is easily changed by factors such as temperature and stress, so it is difficult to become a constant wavelength standard light source

Method used

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  • Full-waveband window-free wavelength standard light source and wavelength calibration method
  • Full-waveband window-free wavelength standard light source and wavelength calibration method
  • Full-waveband window-free wavelength standard light source and wavelength calibration method

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Embodiment Construction

[0019] In order to make the technical problems, technical solutions and beneficial effects to be solved by the present invention clearer and clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.

[0020] like figure 1 As shown, the embodiment of the present invention includes a wide-spectrum light source 1, an achromatic lens pair 2, a pinhole 3, a first collimating lens 4, an optical etalon 5, an atomic line light source 6, a second collimating lens 7, and a semi-reflective Semi-transparent beam splitter 8; the broad-spectrum light source, achromatic lens pair, pinhole, first collimator lens and optical etalon are arranged coaxially, and the described semi-reflective and semi-transparent beam splitter is arranged obliquely, and the second The collimator lens and the atomic spectrum line light source are sequentially coaxially arranged under the semi-reflective and semi-transparent beam splitter....

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Abstract

The invention discloses a full-waveband window-free wavelength standard light source and a wavelength calibration method and relates to the field of wavelength standard light sources. The light sourcecomprises a wide spectrum light source, an achromatic lens pair, a pinhole, a first collimating lens, an optical etalon, a semi-reflective semi-transparent beam splitter, a second collimating lens and an atomic spectrum line light source which are sequentially arranged. The wide spectrum light source is combined with the achromatic lens pair and the pinhole to emit spatially filtered continuous spectrum light beams, the continuous spectrum light beams are filtered by an optical etalon to generate light beams of a comb-shaped spectrum, and then the light beams of the comb-shaped spectrum and light beams emitting known atomic spectral lines are combined by using the semi-reflective semi-transparent beam splitter to obtain light beams with the known atomic spectral lines in the comb-shaped spectrum.

Description

technical field [0001] The invention relates to the field of wavelength standard light sources, in particular to a full-band wavelength standard light source without empty windows and a wavelength calibration method. Background technique [0002] At present, the standard light source used for wavelength calibration of the spectrometer usually adopts light sources with atomic emission lines such as neon lamps, mercury lamps, argon lamps, etc. (Wang Pengcheng et al., Acta Metrology, 2007, Vol. Page), these standard light sources contain a limited number of spectral lines and uneven distribution, often leaving empty windows in some bands. When using these atomic spectral line lamp sources for spectral calibration, due to the limited number of standard spectral lines and uneven distribution, it is difficult to accurately grasp the wavelength deviation trend of each position on the spectral axis, although better calibration can be obtained near the spectral line position , and i...

Claims

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Application Information

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IPC IPC(8): G01J3/10G01J3/28G01J3/44G01J9/00
CPCG01J3/10G01J3/28G01J3/44G01J9/00G01J2003/102
Inventor 刘川任斌
Owner XIAMEN UNIV
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