375 results about "Standard illuminant" patented technology

A method and a device of light source discrimination, skin color correction, and color image correction, and storage medium thereof capable of being read by a computer always enable reproducibility, of color to be maintained highly regardless of difference of light source. There is calculated color distribution of portion of a face or skin in image by color distribution calculation section. There is compared the color distribution with distribution of skin color taken photograph under respective light sources stored in reference color distribution storage section. A light source discrimination section discriminates the light source at the time of taking photograph. There is corrected color by converting color under the light source of candidate substance into a corresponding color under standard light source.

Disclosed herein is a method of performing robust white balance. The method includes a first process of dividing an input image into blocks, a second process of selecting blocks having higher color errors, and calculating average RGB values of the selected blocks, a third process of selecting a specific top percentage of bright blocks, and calculating the average RGB values of these selected blocks, a fourth process of calculating average RGB values through color clustering, a fifth process of converting the average RGB values into CIE xyY color space, a sixth process of calculating the Euclidean distances between the x and y values of standard light sources in a color space and the x and y values of the average RGB values in CIE xyY color space, and selecting an average RGB value having the shortest Euclidean distance (Ed), and a seventh process of calculating white balance gain values using the selected average RGB value, and correcting the input image using the balance gain values.

The invention discloses a wave aberration detection device of an objective lens imaging system. The wave aberration detection device comprises a light source, a collimating mirror, a spectroscope, a focusing mirror, a standard spherical reflector, a data processing unit, a wave-front sensor, a first accurate adjustment table and a second accurate adjustment table, wherein the collimating mirror, the spectroscope, the focusing mirror and the standard spherical reflector are sequentially placed in the light emitting direction of the light source, and the wave-front sensor, the first accurate adjustment table and the second accurate adjustment table are connected with the data processing unit. In the wave aberration detection device, the measurement processes and the system error calibration process are switched by changing the position of the standard spherical reflector 5; in the two measurement processes, the standard spherical reflector 5 has the same adjustment accuracy, and therefore the calibration, measurement and correction of device and system errors can be effectively completed, and the wave aberration measurement accuracy is improved. No high-precision standard light source is needed, and cost is reduced; A system error calibration method of the wave aberration detection device is simple and compact in structure and has the advantages of being easy to obtain and the like, and the wave aberration detection of the objective lens imaging system to be detected can be completed through the simple system.

A light-emitting diode (LED)-based solid-state device comprises a color mixing mechanism to dynamically change the correlated color temperature (CCT) of a white light. With different lumen proportions for white phosphor-coated LEDs and integrated red and green LEDs, the light mixtures can be located in any one of eight CCT quadrangles. In practice, CCTs of a white-light can be tuned in a continuous manner. Because all the possible light mixtures on the chromaticity diagram correspond to a line segment that overlays the Planckian locus within the eight CCT tolerance quadrangles, the effect of LED intensity fluctuations that may put the mixture out of white light region is reduced. Also, because the two additional LEDs that mix with the white phosphor-coated LEDs contribute to the overall spectral power distribution (SPD) that substantially matches the SPD of standard illuminants, a CRI of 80 can be reached.

A reflectance spectrum reconstruction method based on an iterative threshold method includes the following steps that principal component analysis is carried out on a training sample set to obtain primary function vectors of the training sample set, and first three primary function vectors are chosen according to the contribution rate to serve as reconstruction primary function vectors; a standard illuminant and a common RGB camera are adopted to obtain RGB tri-stimulus values of a multi-spectral test image, and by means of a conversion matrix, CIE1931 standard colorimetric observer spectral tri-stimulus values are obtained; according to the obtained primary function vectors of the training sample set, CIE1931XYZ tri-stimulus values of the multi-spectral test image, a CIE1931 standard colorimetric observer color matching function and relative spectral power distribution of the standard illuminant, a reflectivity spectral image of the multi-spectral test image is reconstructed by the adoption of the iterative threshold method.

The invention relates to the field of image processing technology, particularly to a light source detecting equipment and method as well as an image processing method, which are used for gathering images corresponding to the object light source and obtaining sample pixel points of images corresponding to the object light source; computing color parameters of images corresponding to the object light source according to the sample pixel points; comparing the color parameters of images corresponding to the object light source with preset color parameters of various standard light sources, thereby determining a standard light source matched with the object light source. The technical solution of the invention can accurately detect the light source with simple operation.

A spectacle lens having a front surface intended to be fitted away from the eye. The spectacle lens includes a substrate made from mineral glass or an organic material. The spectacle lens has selective light wavelength filter properties. The selective light wavelength filter properties include a spectral transmittance between 80% and 95% for all wavelengths in a wavelength range between 428 nm and 452 nm for a light ray entering the spectacle lens on the front surface at an angle of incidence of 0°, a spectral transmittance between 95% and 100% for all wavelengths in a wavelength range between 500 nm and 700 nm for a light ray entering the spectacle lens on the front surface with an angle of incidence of 0° and a yellowness index of no more than 10 for a standard illuminant D65 and a standard observer function of 2° (D65/2°).

The invention relates to the technical field of image processing, in particular to a mechanical part surface defect detection method based on image processing. The method comprises the following steps: acquiring a surface image of a mechanical part under a standard light source, and acquiring a segmented image of the surface image as a preliminary defect detection result; screening out a to-be-detected region in the segmented image, and performing connected domain extraction and clustering on the to-be-detected region to obtain a plurality of to-be-detected region sets; for each to-be-detected area set, moving the light source, collecting a second surface image, and obtaining feature information of the to-be-detected area set in the second surface image; obtaining an optimal light source corresponding to the maximum defect saliency according to the feature information; and obtaining an optimal image of each to-be-detected region set under the corresponding optimal light source to form a fused image, performing semantic segmentation on the fused image to obtain a second segmented image, and obtaining a detection result. According to the embodiment of the invention, the light source can be adaptively adjusted according to different defects, and an accurate defect detection result is obtained.

The invention discloses a correction method, a device and equipment used for an optical sensor, and a storage medium. The method comprises the following steps of acquiring a reference illumination intensity value output by the optical sensor under standard light source irradiation; acquiring the ratio of the reference illumination intensity value relative to a standard illumination intensity valueunder the standard light source irradiation and taking as the correction coefficient of the optical sensor; acquiring an illumination intensity value to be corrected output by the optical sensor under environment illumination; and taking the product of the illumination intensity value to be corrected and the correction coefficient of the optical sensor as the corrected illumination intensity value of the optical sensor, and according to the corresponding relation of the illumination intensity value of the optical sensor and the backlight brightness of a liquid crystal display screen, adjusting the backlight brightness of the liquid crystal display screen so that the optical sensor outputs the corrected illumination intensity value under the environment illumination. In the invention, a problem that the backlight brightness of the same model of equipment under a same illumination environment is not consistent is solved, and the backlight brightness of the equipment under the same illumination environment is consistent.

An image processing apparatus and method capable of improving illuminant estimation accuracy and performing a stable white balance correction. A specific subject detection unit detects a specific subject having a specific color from assigned image data. A specific chromaticity calculation unit calculates a specific chromaticity from data representing the specific color of the specific subject. Then, a standard chromaticity that approximates to the calculated specific chromaticity is determined from standard chromaticities. A chromaticity difference calculation unit calculates one or more sets of chromaticity difference information representing a chromaticity difference from the determined standard chromaticity to the calculated specific chromaticity. A white chromaticity correction unit obtains one or more white chromaticities corresponding to the selected one or more standard light sources and corrects the one or more white chromaticities by referring to the one or more sets of chromaticity difference information.

The invention provides a method for identifying a hyperspectral material. First a standard light source spectrum database is established, a spectral material standard database is established, and standard light source spectra are obtained through a difference method and a control variable method; spectral data information is shot for a material needing to be identified; through preprocessing and intrinsic material information extraction, spectral characteristics of the material are obtained, and then the spectral characteristics are matched with data in the spectral material standard database, so as to perform high-precision identification of the material. According to the method, the interference to spectral information of the material caused by complex factors such as different illumination conditions and material shape changes and the like can be resisted, the problems of metamerism and homogeneity and heterochrome which cannot be solved through conventional red green blue (RGB) and RGBD cameras are solved, and the identification precision rate is high.

The invention discloses an automatic image data collecting system which comprises a sample transfer control system, an image collecting control system and an optical imaging system. The sample transfer control system is used for transferring samples to a preset position, resting the samples in the preset position and sending image collecting order; the image collecting control system is used for receiving the image collecting order from the sample transfer control system and controlling the image data of the sample collected by the optical imaging system; and the optical imaging system comprises a camera for collecting image data of the samples. The automatic image data collecting system uses the standardized light source system during the image data collecting process of gold, jewel, jade ornaments, automatically collects the image data and solves a series of problems such as low working efficiency, distortion of the received image data, the impossibility of direct usage of the collected images and the like when non-standardized light source is applied to the image collecting process of samples during the data collection of the existing product data base, image collection of the exhibited samples and the image data collection of samples such as jewelry, jade and other ornaments to be appraised.

This invention relates to a method of advancing photometric quantity measuring apparatus accuracy of measurement. Method include; measured light through V ( lambda) regulation then be received by detector to turn to current signal, passing iv transducer turn ro voltage alarm, after magnifying then passing A / D transducer turn to digital signal; processing the digital signal, and send the results to PC machine or scope for presentation;this instrument beforehand has passed difference spectral range standard light source adjust, gain different instrument calibration coefficient; And use homologize wave band's instrument calibration coefficient while use this instrument to measure difference wave band light source. The described standard light source is linear light source that has scaling measured by instrument of higher order of accuracy. The described difference spectral range divided into red green blue yellow white five colors.

A near field non-standard light source-based in situ obtaining method for three dimensional polishing scratch shapes is disclosed. Six LED lights uniformly distributed on a hand held microscope are used as light sources, an illumination model for non-standard light sources is built in near field conditions, relative spatial positions of the light sources are calibrated, the hand held microscope isused for collecting image data of worn-out surfaces of parts, a Mask image is obtained based on image processing technologies, images under the same viewpoint and different light sources are subjected to background difference processing operation, an object image which requires three dimensional rebuilding is obtained, and a final three dimensional polishing scratch shape is rebuilt via iterationbased on combination of a technology for estimating a normal direction based on an image sequence and a technology of recovering surface shapes from the normal direction. According to an actual lightsource position, the illumination model for the near field non-standard light sources is built via use of the method disclosed in the invention after photometric stereo visual near field non-standardpoint light sources are adopted, the method can meet requirements of real measurement conditions, and calculation precision of normal vector and depth information of worn-out surfaces can be improved.

The invention discloses a wavelength calibration way for a optical fiber spectrometer, and consists of the following steps, A) a standard light source is applied, standard spectrum is collected through the spectrometer, the image element order number k_i of spectrometer receiving element linear array CCD is determined corresponding to the standard light source of different practical wavelength Lambada_i; B) the arbitrary three practical wavelength Lambada _i and the corresponding image element order number k_i are chosen, and in accordance with the above formula, a₁, a₂, and a₃ are determined; C) according to the values of a₁, a₂, a₃ from step B), the calibration calculation wavelength value Lambada_i is determined corresponding to every image element order number k_i, wherein, the Lambada_i is a calibrated wavelength value. The calibrating way of the optical fiber spectrometer is provided by the present invention, the calibration deviation of the calibrating way is much smaller than the calibration deviation of the prior art, and accurate calibration can be done with 3 arbitrary standard spectrum lines, not only the flexibility of the calibration is improved but also the application is easier and more convenient. The invention discloses the calibrated spectrometer applying the above mentioned way at the same time.

The embodiment of the invention discloses a color temperature sensor calibration method and a related device. According to the color temperature sensor calibration method, after the base noises of a color temperature sensor are calibrated by utilizing calculated color temperature errors, the color temperature values of P standard light sources are tested by utilizing the color temperature sensor with calibrated base noises, thus obtaining P test color temperature values; the function relationship y=f(x) between the test color temperatures and the standard color temperatures is derived by utilizing the P test color temperature values and the standard color temperature values of the P standard light sources; and the function relationship y=f(x) is used for calibrating the color temperature value of the color temperature sensor of a photographing terminal detected in the photographing process of the photographing terminal. The technical solution provided by the embodiment of the invention is beneficial for carrying out relatively excellent and scientific calibration to the color temperature sensor of the photographing terminal.

The invention relates to a method for detecting the whiteness of raw silks, and in particular relates to a method for judging the types of raw silks of fresh cocoons and raw silks of dried cocoons, and identifying the type differences of raw silks. The invention discloses a method for detecting raw silks of fresh cocoons by using a color photometer, which comprises the following specific steps: connecting a spectro-color photometer with a computer, starting a switch of the color photometer, setting a standard light source, opening a color quality control system, carrying out zero correction and whiteboard correction, and establishing data storage files and the like. According to the invention, by using the characteristics of color difference among different raw silks, the exponential value of whiteness is measured by using a spectro-color photometer, and according to a rule that the exponential value of whiteness of raw silks of fresh cocoons is greater than the exponential value of whiteness of raw silks of dried cocoons, the dried and fresh types of raw silks are judged. The method disclosed by the invention has the advantages that the method is rapid, accurate and convenient and the like, facilitates the accurate grasping of quality of raw silks, and ensures the quality of products and the production efficiency of silk articles.

The invention provides a debugging method of an echelle grating spectrograph, belonging to the technical field of spectrums. The method comprises the following steps: allocating a laser, a standard light source and a plane mirror for debugging; installing an optical system and detector assemblies of the spectrograph by taking the laser light as reference beam, and replacing the echelle grating by the plane mirror; replacing the standard light source, adjusting the position of the detector according to a spectrum image obtained on the detector to optimize the whole image quality; according to the deviation between an X-directional position of light spots on the spectrum and a spectral line position of an ideal spectrum model, adjusting the placing angle of a reflecting prism unit; replacing the plane mirror by the echelle grating, and adjusting a pitch angle of the echelle grating according to an Y-directional position of the light spots in the spectrum; and comparing the spectrum images of the adjusted detector with the ideal spectrum models, when the spectrum images are similar to the ideal spectrum models, reversely calculating accurate state parameters according to the practical spectrum and adjusting the spectrum models to adapt to the practical images. The method has the advantages that less tools are need and the operation is simple; and furthermore, the debugging operation of the echelle grating spectrograph can be effectively simplified.