Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Fault diagnosis method for anti-interference rotating machine

A technology for rotating machinery and fault diagnosis, applied in the testing of mechanical components, testing of machine/structural components, measuring devices, etc., can solve problems such as spectrum leakage, achieve good noise robustness, and overcome the effect of spectrum leakage

Active Publication Date: 2019-11-08
SICHUAN UNIV
View PDF5 Cites 8 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Because the wavelet packet filter can effectively measure the high-frequency transient components of the signal, but the wavelet packet filter has a dichotomous characteristic, and it is easy to form a spectrum leakage in the center of the analysis frequency

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Fault diagnosis method for anti-interference rotating machine
  • Fault diagnosis method for anti-interference rotating machine
  • Fault diagnosis method for anti-interference rotating machine

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0046] The invention provides a method for fault diagnosis of an anti-interference rotating machine, which includes the following steps:

[0047] Step 1 is to preprocess the rotating machinery fault data signal. The preprocessing described here is to use the mean value method and the least square method to perform DC component and detrend item preprocessing on the data respectively.

[0048] In step two, the signal in step one is decomposed by using a Meyer wavelet filter bank. It should be noted that the signal decomposition here is decomposed into a series of sub-bands divided into two and divided into three.

[0049] It should be noted that the signal decomposition in step 2 specifically includes the following steps:

[0050] (1) Construction of Meyer wavelet filter bank;

[0051] (2) Construction of a split-two, split-three decomposition tree;

[0052] (3) Calculate the multiple decolorization cycle harmonic ratio (MDCHR) of each sub-band in the two decomposition trees....

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a fault diagnosis method for an anti-interference rotating machine. The method comprises the steps that a fault data signal of the rotating machine is preprocessed; a Meyer wavelet filter group is adopted for decomposing the signal in step 1; a multi-decoloring cycle harmonic rate value of each sub-band in a decomposition tree in step 2 is calculated; a square envelope spectrum parsing a sub-signal with the largest multi-decoloring cycle harmonic rate value in a multi-decoloring cycle harmonic rate diagram is selected as a diagnosis result; if a multi-decoloring cycle harmonic rate is greater than 2 times of a historical value, it is diagnosed that the probability of a fault in a diagnostic object is greater than 80%. The multi-decoloring cycle harmonic rate is constructed to characterize a band signal-to-noise ratio, is used for replacing a spectral kurtosis index in a fast spectral kurtosis diagram; a Meyer wavelet filter adopted in a wavelet is used for decomposing the signal to replace an FIR filter in the fast spectral kurtosis diagram, and the Meyer wavelet filter can solve the spectral leakage problem in the center of an analysis frequency of a wavelet packet.

Description

technical field [0001] The invention relates to the technical field of operation and maintenance of rotating machines, in particular to a fault diagnosis method for anti-interference rotating machines. Background technique [0002] Rotating machinery (such as gear boxes, bearings and other units) is a kind of widely used mechanical equipment, and its early minor failure may cause large economic losses in the later period, and even casualties. Therefore, it is very necessary to carry out status detection and fault diagnosis. Vibration analysis method is an effective method for fault diagnosis of rotating mechanical equipment, and envelope demodulation is an effective diagnosis method in vibration analysis method. The key step in the envelope demodulation vibration analysis method is to find the spectral resonance band formed by the fault vibration source related to the rotating component or part in the vibration signal, and demodulate the fault impact signal from it. [000...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01M13/00G01M13/021G01M13/028G01M13/045
CPCG01M13/00G01M13/021G01M13/028G01M13/045
Inventor 苗强罗冲莫贞凌蒋京代文鑫刘慧宇王剑宇曾小飞张恒
Owner SICHUAN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com