Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Infrared image target detection method based on deep transfer learning and extreme learning machine

An extreme learning machine and transfer learning technology, applied in the field of image detection, can solve the problems of data waste and large manpower

Active Publication Date: 2019-11-08
TIANJIN UNIV
View PDF6 Cites 29 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

There is a serious disadvantage in the traditional machine learning method: it is assumed that the training data and the test data obey the same data distribution, but this assumption is not satisfied in many cases, and it usually takes a lot of manpower and resources to relabel a large amount of data to meet the training requirements. It causes a waste of data; while transfer learning can extract and transfer knowledge from existing data to complete new learning tasks

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Infrared image target detection method based on deep transfer learning and extreme learning machine
  • Infrared image target detection method based on deep transfer learning and extreme learning machine
  • Infrared image target detection method based on deep transfer learning and extreme learning machine

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0020] After searching, it is found that there are few patents on infrared small sample target detection. This patent solves the problem of infrared small sample from the aspects of transfer learning and extreme learning machine. In the real world, visible light images occupy the absolute proportion of image distribution. The current deep learning image target detection, segmentation, tracking and other tasks are mostly based on a large number of labeled visible light images, but visible light images are detected at night and in complex weather conditions. The recognition accuracy is greatly reduced, and infrared images greatly fill in the defects of visible light through the characteristics of energy imaging, but the cost of infrared sample labeling is high, and there is a lack of a large number of labeled infrared data sets in the real world. Through the migration of visible light to infrared, the target detection accuracy of infrared images is improved.

[0021] This patent...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to an infrared image target detection method based on deep transfer learning and an extreme learning machine. The infrared image target detection method comprises the following steps: training a visible light image target detection model, training on a visible light sample set D by using a maskrcnn two-stage multi-task detection architecture, inputting a mask mask into a neural network, and redefining a loss function of an overall network structure; based on a sample migration method, obtaining a data set of migration learning by expanding the distribution of a target domain, namely an infrared sample set T; based on a model migration method, taking a target detection model with high precision based on a visible light image as a pre-training model of the generated migration learning data set, and carrying out training by adopting the same framework as visible light target detection; adopting an extreme learning machine to replace a network full connection layer, so as to overcome the over-fitting phenomenon of small sample model migration training.

Description

technical field [0001] The invention belongs to the field of image detection and relates to an infrared image target detection method. Background technique [0002] At present, small sample learning is a research hotspot in deep learning. There are a large number of unlabeled images in the real world. The realization of detection tasks relies on a large amount of labeled data, which greatly increases the cost of time and money. There is a serious disadvantage in the traditional machine learning method: it is assumed that the training data and the test data obey the same data distribution, but this assumption is not satisfied in many cases, and it usually takes a lot of manpower and resources to relabel a large amount of data to meet the training requirements. It causes a waste of data; while transfer learning can extract and transfer knowledge from existing data to complete new learning tasks. As a branch of machine learning, the original intention of transfer learning is t...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06K9/00G06N3/08
CPCG06N3/08G06V20/10
Inventor 杨嘉琛孙建建
Owner TIANJIN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products