bms hardware-in-the-loop test system and test method

Abstract

The invention relates to the technical field of hardware-in-the-loop testing systems, in particular to a BMS hardware-in-the-loop testing system and a testing method. The in-the-loop test system includes: a battery simulation unit, the output end of the battery simulation unit is provided with a first connector; a signal conditioning unit, the output end of the signal conditioning unit is provided with a second connector; and a fault An injection unit, the input end and the output end of the fault injection unit are respectively provided with a third plug-in piece and a fourth plug-in piece, and the third plug-in piece is connected to the first plug-in piece and the second plug-in piece Fittings are matched. In the BMS hardware-in-the-loop test system of the present invention, connectors are provided at the output end of the battery simulation unit and the input end and output end of the fault injection unit, so that the fault injection unit can be switched between the master control module and the slave control module, Moreover, fault injection to any slave control module can be realized, which improves the test condition coverage and utilization efficiency of the test system.

Description

technical field [0001] The invention relates to the technical field of hardware-in-the-loop testing systems, in particular to a BMS hardware-in-the-loop testing system and a testing method. Background technique [0002] The battery management system (BMS) mainly includes a main control module and a slave control module. The main control module is mainly responsible for the processing of control logic, and the slave control module is mainly responsible for the real-time collection of cell voltage and temperature. Due to the large number of voltage and temperature sampling channels of the BMS slave control module (usually more than 100 channels), the fault injection unit of most BMS hardware-in-the-loop test systems currently on the market cannot realize the voltage and temperature sampling channels of any slave control module. The operation of automatic fault injection (short circuit, open circuit, reverse connection, etc.) reduces the test coverage and efficiency of the test...

AI Technical Summary

Problems solved by technology

Due to the large number of voltage and temperature sampling channels of the BMS slave control module (usually more than 100 channels), the fault injection unit of most BMS hardware-in-the-loop test systems currently on the market cannot realize the voltage and temperature sampling channels of any slave control module. The operation of automatic fault injection (short circuit, open circuit, reverse connection, etc.) reduces the test condition coverage and efficiency of the test system

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