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A Reliability Index Evaluation Method of Instrument Electronic Control System

An electronic control system, reliability technology, applied in general control systems, control/regulation systems, environment/reliability testing, etc. Quality, effect of shortening test duration

Active Publication Date: 2022-08-05
广东科鉴检测工程技术有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

If the conventional reliability and life test methods are used to evaluate the reliability and life characteristics of the product, it often takes unbearable time and cost, and even before the test is completed, the product has been updated or eliminated due to backward performance
Obviously, such a long test time not only misses the best time to improve product reliability, but also seriously affects the progress of research and development, which is unacceptable in engineering practice

Method used

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  • A Reliability Index Evaluation Method of Instrument Electronic Control System
  • A Reliability Index Evaluation Method of Instrument Electronic Control System
  • A Reliability Index Evaluation Method of Instrument Electronic Control System

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Experimental program
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Embodiment 1

[0056] This embodiment provides another method for evaluating the reliability index of the electrical control system of the instrument, such as figure 2 shown, figure 2 It is a flowchart of another method for evaluating the reliability index of an electrical control system of an instrument according to the first embodiment of the present invention, including the following steps:

[0057] Step S201: Check the appearance of the electronic complete machine to which the electronic control system belongs and test the technical state of the electronic complete machine; determine whether the electronic complete machine is a qualified product; if so, perform steps S202 to S209; if not, end the process;

[0058] In the embodiment of the present invention, the above-mentioned electronic complete machine may be a dual-frequency full-digital high-frequency ocean sounder, and the dual-frequency full-digital high-frequency ocean sounder is mainly composed of four parts: a receiver, a tran...

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Abstract

The invention discloses a reliability index assessment method for an electronic control system of an instrument, wherein the method includes: in a normal temperature environment, conducting a field test on an electronic complete machine belonging to the electronic control system, and recording the performance parameters after the field test; Acceleration factor of the complete electronic machine; according to the acceleration factor and the field test duration of the complete electronic machine, calculate the duration of the laboratory test of the complete electronic machine; under the stress of high temperature environment, carry out the laboratory test of the complete electronic machine, and record the laboratory test After analyzing the performance parameters after the field test of the electronic complete machine and the performance parameters after the laboratory test, calculate the number of test faults and fault categories of the electronic complete machine; reliability of the control system. The invention can not only shorten the test period, but also accurately detect the fault of the product, which is beneficial to the R&D personnel to better improve the electric control system of the product and improve the quality of the product.

Description

technical field [0001] The invention relates to the technical field of reliability testing, in particular to a reliability index assessment method of an instrument electric control system. Background technique [0002] With the increasingly fierce market competition, there are more and more high-reliability and long-life products in the field of household appliances. If the conventional reliability and life test methods are used to evaluate the reliability and life characteristics of the product, it often takes unbearable time and cost, and even before the test is completed, the product has been updated or eliminated because of its backward performance. Obviously, such a long test time not only misses the best opportunity to improve product reliability, but also seriously affects the progress of research and development, which is unacceptable in engineering practice. Therefore, it is necessary and important to use the accelerated life test method to evaluate the reliability...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G05B23/02G01R31/00
CPCG05B23/0256G01R31/003
Inventor 鲍黎涛杨道建文武高军
Owner 广东科鉴检测工程技术有限公司
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