A method for adjusting the band gap in the preparation of hexagonal boron nitride thin films
A technology for preparing hexagonal boron nitride and thin films, which is applied in metal material coating process, vacuum evaporation plating, coating, etc., can solve the problems of large bandgap width of hexagonal boron nitride and poor coverage, etc., to achieve The effect of low cost and simple equipment
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Embodiment 1
[0029] 1) Take four pieces of quartz as insulating substrates, place them in acetone, absolute ethanol and deionized water in turn for ultrasonic cleaning, and dry them;
[0030] 2) Put a quartz substrate on the bracket in the magnetron sputtering furnace, close the furnace door, and reduce the vacuum in the furnace to no higher than 5×10 -3 Pa;
[0031] 3) Introduce a mixture of nitrogen and hydrogen into the sputtering furnace, the proportion of nitrogen is 20%, and the insulating substrate is heated to 400°C, the pressure is adjusted to 1.5Pa, and magnetron sputtering is performed for 1 hour;
[0032] 4) Heating the substrate and the film to 700° C., and annealing for at least 1 hour under the protection of an inert gas.
[0033] 5) Repeat steps 2, 3, and 4 in turn for the second to fourth quartz substrates, wherein the proportions of nitrogen gas during sputtering are adjusted to 46.7%, 73.3% and 100% respectively. The absorption band edge of the prepared hexagonal boron...
Embodiment 2
[0036] 1) Take four monocrystalline silicon wafers as insulating substrates, place them in acetone, absolute ethanol and deionized water in sequence for ultrasonic cleaning, and dry them;
[0037] 2) Put a quartz substrate on the bracket in the magnetron sputtering furnace, close the furnace door, and reduce the vacuum in the furnace to no higher than 5×10 -3 Pa;
[0038] 3) Feed a mixture of nitrogen and hydrogen into the sputtering furnace, grow a hexagonal boron nitride film under the conditions in Table 1, and magnetron sputter for 1 hour;
[0039] Table 1
[0040] Sample serial number 1 2 3 4 Substrate temperature (°C) 400 300 400 400 Sputtering power (W) 300 300 400 300 Sputtering pressure (Pa) 1.5 1.5 1.5 1.0
[0041] 4) Heating the substrate and the film to 700° C., and annealing for at least 1 hour under the protection of an inert gas.
[0042] 5) Utilize the Fourier transform infrared spectrophotometer to measure the in...
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