Improved detection method for environment and light in product appearance defect detection
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- SHENZHEN HUIWANCHUAN PLASTIC FILM CO LTD
- Publication Date
- 2020-03-06
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Figure 1
Abstract
Description
technical field
[0001] The invention belongs to the technical field of product detection, and more specifically relates to an improved detection method for environment and light in product appearance defect detection. Background technique
[0002] In the production process of various plates, the plate shows that it is easy to have defects due to production problems, but some defects are relatively small and cannot be easily observed by human eyes, which makes the defects on the surface of the plate very difficult. Obtained, will make defective defective plates sold out, resulting in low product quality, but the detection of products in the existing technology is easily affected by the dust on the product surface, so that when the camera is shooting, it is very difficult It is easy to mistake dust for a defective product, which leads to low quality of the product, and there are also great defects in the lighting of the prior art, which makes the light bright and dark, and als...