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Control method and device for processing equipment

A technology of process equipment and control method, applied in the direction of program control, measuring device, comprehensive factory control, etc., can solve problems such as low product yield, waste of processing materials, shutdown of process equipment, etc., to reduce scrap rate and improve product yield , to avoid the effect of wasting

Inactive Publication Date: 2020-03-24
SHENZHEN CHINA STAR OPTOELECTRONICS SEMICON DISPLAY TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] However, when there are too many defects, manual work cannot deal with multiple defects in time, so it is easy to flow unqualified panels into the subsequent process, wasting processing materials, and because the abnormal process equipment cannot be shut down, the number of scrapped panels increases, so lead to lower product yield

Method used

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  • Control method and device for processing equipment
  • Control method and device for processing equipment
  • Control method and device for processing equipment

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Embodiment Construction

[0022] The following descriptions of the various embodiments refer to the accompanying drawings to illustrate specific embodiments in which the present invention can be practiced. The directional terms mentioned in the present invention, such as "up", "down", "front", "back", "left", "right", "inside", "outside", "side", etc., are for reference only The orientation of the attached schema. Therefore, the directional terms used are used to illustrate and understand the present invention, but not to limit the present invention. In the figures, structurally similar units are denoted by the same reference numerals.

[0023] The terms "first", "second" and the like in the specification and claims of the present application and the above drawings are used to distinguish different objects, rather than to describe a specific order. Furthermore, the terms "include" and "have", as well as any variations thereof, are intended to cover a non-exclusive inclusion.

[0024] The panel manuf...

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Abstract

The invention provides a control method and device for processing equipment, and the method comprises the steps: detecting each display panel prepared by each processing equipment in a preset duration, determining the type of a defect when the defect of the display panel is detected, obtaining the number of defects, and obtaining a plurality of pieces of detection data; obtaining the total numberof various defects of the display panel prepared by each processing equipment according to the plurality of detection data; judging whether the processing equipment is abnormal or not according to thetotal number of various defects; and if the processing equipment is abnormal, carrying out abnormality processing on the processing equipment. According to the control method and device of the processing equipment, the product yield can be improved.

Description

【Technical field】 [0001] The present invention relates to the field of display technology, in particular to a method and device for controlling process equipment. 【Background technique】 [0002] At present, when the detection equipment detects a defect of the display panel, the defect is manually analyzed to determine whether the process equipment is abnormal. If there is an abnormality, the abnormal process equipment is manually shut down. [0003] However, when there are too many defects, manual work cannot deal with multiple defects in time, so it is easy to flow unqualified panels into the subsequent process, wasting processing materials, and because the abnormal process equipment cannot be shut down, the number of scrapped panels increases, so Resulting in lower product yield. [0004] Therefore, it is necessary to provide a control method and device for process equipment to solve the problems existing in the prior art. 【Content of invention】 [0005] The object of ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/00
CPCG01M11/00G05B19/4184G05B2219/31355G05B2219/32222G05B2219/35481G05B2219/45174Y02P90/02G05B19/4183G05B19/41865G05B19/41875
Inventor 闫立磊
Owner SHENZHEN CHINA STAR OPTOELECTRONICS SEMICON DISPLAY TECH CO LTD