Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A light emitting diode and its manufacturing method

A technology of light-emitting diodes and light-emitting layers, which is applied in the direction of semiconductor devices, electrical components, circuits, etc., can solve the problems of terminal product modules that cannot operate normally and reduce product stability, and achieve both light extraction efficiency and interlayer stress intensity. Improves the effect of resistance characteristics

Active Publication Date: 2021-10-29
XIAMEN SANAN OPTOELECTRONICS CO LTD
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] see figure 1 In consideration of the light extraction efficiency, the electrode structure design of the existing LED chip adds a high-reflectivity material to the electrode structure as the reflective layer 200 to improve light efficiency, but most of the high-reflective materials: such as silver, aluminum, etc., have poor characteristics. The stability of the product is reduced by the influence of the environment, temperature, humidity, pH, etc., so a metal protection layer 230 with low mobility is covered for protection, but this design can only prolong the reaction time of the reflective layer material and the environment, and cannot completely Avoid major abnormalities such as metal material migration or precipitation and electrode shedding, which will cause the terminal product module to fail to operate normally; and therefore, the electrode structure design will limit product design and application fields, such as high current and high voltage drive, extreme environments, etc.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A light emitting diode and its manufacturing method
  • A light emitting diode and its manufacturing method
  • A light emitting diode and its manufacturing method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0036] The implementation of the present invention will be described in detail below in conjunction with the accompanying drawings and examples, so as to fully understand and implement the process of how to apply technical means to solve technical problems and achieve technical effects in the present invention. It should be noted that, as long as there is no conflict, each embodiment and each feature in each embodiment of the present invention can be combined with each other, and the formed technical solutions are all within the protection scope of the present invention.

[0037] It should be understood that the terminology used in the present invention is only for the purpose of describing specific embodiments, rather than limiting the present invention. It is further understood that when the terms "comprising" and "comprising" are used in the present invention, they are used to indicate the existence of stated features, integers, steps, components, and / or without excluding on...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
lengthaaaaaaaaaa
widthaaaaaaaaaa
bulk modulusaaaaaaaaaa
Login to View More

Abstract

The present invention provides a light-emitting diode, comprising: a first electrode electrically connected to the first semiconductor layer of the light-emitting diode, a second electrode electrically connected to the second semiconductor layer, the first electrode and / or the second electrode sequentially comprising a second A reflective layer, a pad layer, and a second reflective layer at least partially covering the pad layer, the first reflective layer and / or the second reflective layer include a material with a Mohs hardness of not less than 6, and the high hardness material prevents the pad layer from It is deformed and crushed by external force, which improves the reliability of the light-emitting diode.

Description

technical field [0001] The invention relates to the field of semiconductor manufacturing, in particular to a light-emitting diode with high-reliability electrodes. Background technique [0002] see figure 1 In consideration of the light extraction efficiency, the electrode structure design of the existing LED chip adds a high-reflectivity material to the electrode structure as the reflective layer 200 to improve light efficiency, but most of the high-reflective materials: such as silver, aluminum, etc., have poor characteristics. The stability of the product is reduced by the influence of the environment, temperature, humidity, pH, etc., so a metal protection layer 230 with low mobility is covered for protection, but this design can only prolong the reaction time of the reflective layer material and the environment, and cannot completely Avoid major abnormalities such as metal material migration or precipitation and electrode shedding, which will cause the terminal product ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01L33/38H01L33/46H01L33/54
CPCH01L33/385H01L33/46H01L33/54
Inventor 陈柏羽邓有财张中英
Owner XIAMEN SANAN OPTOELECTRONICS CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products