Unlock instant, AI-driven research and patent intelligence for your innovation.

Test method and device for cmos image sensor

An image sensor and test device technology, applied in image communication, television, electrical components, etc., can solve the problem of low efficiency of CMOS image sensors, achieve the effect of improving test efficiency and liberating manpower

Active Publication Date: 2021-10-19
JACAL ELECTRONICS WUXI
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In order to solve the above-mentioned technical problems, the present invention provides a CMOS image sensor testing method and device to solve the problem of low efficiency of CMOS image sensor testing in the prior art, reduce the degree of manual participation, improve the degree of automation, and improve the efficiency of testing. efficiency

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Test method and device for cmos image sensor
  • Test method and device for cmos image sensor

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0021] Such as figure 2 As shown, the test device for the CMOS image sensor provided in Embodiment 1 of the present invention includes a test device 1, a handling device 2, and a control device 3 (in this field, the test device is generally referred to as a tester, and the handling device is referred to as a handler for short). During the test process, the automatic comparison of the number of good products and the automatic judgment of good products are realized by controlling the work of the test device and the handling device, reducing the degree of manual participation, improving the degree of automation, and improving test efficiency; for the convenience of implementation, a CMOS is provided in this embodiment 1 Test methods for image sensors such as figure 1 shown, including:

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The testing method of the CMOS image sensor provided by the present invention relates to the testing of the image sensor, including testing a batch of CMOS image sensors, judging whether the quantity of good products in the test information is equal to the quantity of good products in the handling information, and if they are equal, continue to execute; If not equal, then suspend the execution of the CMOS image sensor test method and wait for inspection; if the number of good products in the test information is equal to the number of good products in the handling information, judge whether the good product rate is lower than the preset value according to the test information, if the good product rate is not low At the preset value, continue to execute; if the yield rate is lower than the preset value, then suspend the execution of the CMOS image sensor test method and wait for inspection; if the yield rate is not lower than the preset value, release the batch of CMOS image sensors to enter the next step process. The invention effectively solves the problem of low test efficiency of the CMOS image sensor in the prior art, realizes automatic comparison of the number of good products and judgment of good product rate, liberates manpower, and improves test efficiency.

Description

technical field [0001] The invention relates to image sensor testing, in particular to a CMOS image sensor testing method and device. Background technique [0002] The performance parameters of CMOS image sensors are generally evaluated and measured by the manufacturer during design and production, and typical values ​​are given. However, due to changes in the production process and semiconductor materials, the actual performance parameters of the image sensor used by the user may differ from the typical values ​​given. There are certain discrepancies, so the manufacturer needs to test the CMOS image sensor, and compare the number of good products after the test with the total amount of the test to determine whether the batch is qualified. In the existing test, it is necessary to manually check whether the number of good products picked up by the handling device after the test is consistent with the number of good products in the test; at the same time, it is necessary to ma...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H04N17/00
CPCH04N17/00
Inventor 王国建谭磊
Owner JACAL ELECTRONICS WUXI