Magnetic flux testing device for 3D planar Hall chip
A technology of planar Hall and testing device, which is applied in the direction of the size/direction and sorting of the magnetic field, which can solve the problem that the chip cannot be transported to the test fixture, so as to improve the test efficiency and avoid the effect of residual magnetism
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[0023] The present invention will be further described below in conjunction with specific embodiments. It should be understood that the following examples are only used to illustrate the present invention and not to limit the scope of the present invention.
[0024] Such as figure 1 As shown, a magnetic flux testing device 10 for a 3D planar Hall chip according to the present invention is shown. Such as figure 1 As shown, the Hall chip magnetic flux test device 10 is installed on a SOT23 chip packaging test sorting machine 300 to realize the magnetic flux test of the Hall chip by applying magnetism to the SOT23 package test sorting machine. The existing SOT23 chip The packaging test sorting machine 300 adopts a turntable structure. The packaging test sorting machine 300 includes a worktable 301 and a turntable 302 located above the worktable 301. The turntable 302 is provided with a plurality of suction nozzles 303 evenly distributed along its circumference During the test, two ...
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