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Microscope, method of operating a microscope and method of imaging a sample

A technology for microscopes and samples, applied in the field of microscopes, can solve problems such as the limitation of the shape of the cuvette, difficult to manufacture, etc., and achieve the effect of improving the accuracy

Inactive Publication Date: 2020-04-21
VIVENTIS MICROSCOPY SARL
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Although this minimizes refraction of the illumination beam, such cuvettes are limited in shape, may be more difficult to manufacture, and may limit the observable area with good image quality

Method used

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  • Microscope, method of operating a microscope and method of imaging a sample
  • Microscope, method of operating a microscope and method of imaging a sample
  • Microscope, method of operating a microscope and method of imaging a sample

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Embodiment Construction

[0050] In the following description, certain terms are used for convenience reasons and are not intended to limit the present invention. The terms "right", "left", "upper", "lower", "below" and "above" refer to directions in the drawings. The terms include the terms explicitly mentioned as well as their derivatives and terms with similar meanings. Additionally, spatially relative terms such as "below," "beneath," "lower," "above," "upper," "proximal," "distal," etc. may be used to describe The relationship of one element or feature to another element or feature. These spatially relative terms are intended to encompass different positions and orientations of the device in use or operation in addition to the positions and orientations shown in the figures. For example, if the device in the figures is turned over, elements described as "below" or "beneath" other elements or features would then be oriented "above" or "above" the other elements or features. Thus, the exemplary t...

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Abstract

A microscope (1) for imaging a sample (61) comprises (i) at least one illumination objective (2) arranged to eject an illumination light beam (21) along an illumination path (22) to illuminate the sample (61); (ii) an imaging objective (3) arranged to receive detection light (31) comprising at least a portion of the light ejected from the sample (61), wherein the detection light (31) is propagatedalong a detection axis (35) angled preferably at about 90 degrees to the illumination path (22) and the imaging objective (3) has an imaging focal plane (34); (iii) an adjustment arrangement (4) to linearly displace the illumination light beam (21) and the imaging focal plane (34) relative to each other along the detection axis (35); (iv) a sample holder (6) arranged to receive a sample (61) andhaving a portion which is transparent to the illumination light beam (21) and to the detection light (31); and (v) a holder support arranged to receive the sample holder (6) and to displace the sampleholder (6) relative to the imaging objective (3) such that the imaging focal plane (34) is positioned inside the sample holder (6).

Description

technical field [0001] The invention relates to a microscope according to the preamble of independent claim 1, and more particularly to a method of operating a microscope, a method of imaging a sample and a computer program for operating a microscope. A microscope having at least one illumination objective arranged to emit an illumination beam along an illumination path to illuminate a sample and an imaging objective arranged to receive detection light comprising at least a portion of the light emitted from the sample for imaging and analyzing the sample sample. Background technique [0002] Light sheet (LS) or selective plan illumination microscopy (SPIM) is a method of fluorescence microscopy in which the illumination beam path (excitation light) and detection beam path (exit light from the sample) are substantially perpendicular to each other. The sample is placed at the intersection of these paths in the focal plane of the imaging objective. For optimal image quality a...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G02B21/00G02B21/33H04N23/75
CPCG02B21/0032G02B21/0048G02B21/33G02B21/0076G02B21/26H04N23/54H04N23/55H04N23/56H04N23/75
Inventor P·斯特尔纳德A·博尼
Owner VIVENTIS MICROSCOPY SARL