Microscope, method of operating a microscope and method of imaging a sample
A technology for microscopes and samples, applied in the field of microscopes, can solve problems such as the limitation of the shape of the cuvette, difficult to manufacture, etc., and achieve the effect of improving the accuracy
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[0050] In the following description, certain terms are used for convenience reasons and are not intended to limit the present invention. The terms "right", "left", "upper", "lower", "below" and "above" refer to directions in the drawings. The terms include the terms explicitly mentioned as well as their derivatives and terms with similar meanings. Additionally, spatially relative terms such as "below," "beneath," "lower," "above," "upper," "proximal," "distal," etc. may be used to describe The relationship of one element or feature to another element or feature. These spatially relative terms are intended to encompass different positions and orientations of the device in use or operation in addition to the positions and orientations shown in the figures. For example, if the device in the figures is turned over, elements described as "below" or "beneath" other elements or features would then be oriented "above" or "above" the other elements or features. Thus, the exemplary t...
PUM
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